High Power Laser and Particle Beams, Volume. 36, Issue 4, 043015(2024)

Analysis of standards and test methods for aircraft and subsystem lightning effects

Gong Chen, Dong Jiang, Qifu Wang, Shichao Zeng, and Feng Wang
Author Affiliations
  • The 10th Research Institute of China Electronics Technology Group Corporation, Chengdu 610036, China
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    Figures & Tables(3)
    • Table 1. High voltage testing items and requirements

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      Table 1. High voltage testing items and requirements

      testing itemsregionsnumbers of test set-upwaveform
      DO160G.23 (EUROCAE ED14G.23) 、HB6167.25SAE ARP 5416A、GJB3567ADO160G.23 (EUROCAE ED14G.23) 、HB6167.25SAE ARP 5416A、GJB3567ADO160G.23 (EUROCAE ED14G.23) 、HB6167.25SAE ARP 5416A、GJB3567A
      initial leader attachment test1A、1B1A、1B13DA、D
      swept channel attachment test1C、2A、2B、3N1C、2A、2B22AA
      high voltage strike attachment test on models///2/C、D
    • Table 2. High current testing items and requirements

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      Table 2. High current testing items and requirements

      testing itemsregionsnumbers of test set-upwaveform
      DO160G.23 (EUROCAE ED14G.23)、HB6167.25SAE ARP 5416A、GJB3567ADO160G.23 (EUROCAE ED14G.23)、HB6167.25SAE ARP 5416A、GJB3567ADO160G.23 (EUROCAE ED14G.23)、HB6167.25SAE ARP 5416A、GJB3567A
      arc entry test1A、1B、1C、2A、2B、3N1A、1B、1C、2A、2B11component A、Ah、A/5、B、C、C*、Dcomponent A、Ah、B、C、C*、D
      non-conductive surfaces test/1A、1C、2A/1/component A、Ah or D
      conducted current test/3/1/component A、B、C、Ah or D
      induced transients in external mounted hardware1A、1B、1C、2A、2B、3N1A、1B、1C、2A、2B11refer to arc entry test and conducted current testrefer to arc entry test and conducted current test
      fuel system testrefer to arc entry test and conducted current testrefer to arc entry test and conducted current test21refer to arc entry test and conducted current testrefer to arc entry test and conducted current test
    • Table 3. Indirect effects testing items and requirements

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      Table 3. Indirect effects testing items and requirements

      testing itemstest levelnumber of test set-upswaveform
      DO160G.22 (EUROCAE ED14G.22)、HB6167.24SAE ARP 5416A、GJB3567ADO160G.22 (EUROCAE ED14G.22)、HB6167.24SAE ARP 5416A、GJB3567ADO160G.22 (EUROCAE ED14G.22)、HB6167.24SAE ARP 5416A、GJB3567A
      pulse current aircraft test/1/1/component A、Ah
      pin injection test55233、4、5A3、4、5A
      wire bundle test55221~61~6
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    Gong Chen, Dong Jiang, Qifu Wang, Shichao Zeng, Feng Wang. Analysis of standards and test methods for aircraft and subsystem lightning effects[J]. High Power Laser and Particle Beams, 2024, 36(4): 043015

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    Paper Information

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    Received: Oct. 31, 2023

    Accepted: Feb. 6, 2024

    Published Online: Apr. 22, 2024

    The Author Email:

    DOI:10.11884/HPLPB202436.230384

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