[1] [1] Su Xianyu, Cheng Xiaoxue, Guo Lürong. An automated method for 360° surface measurement of 3-D objects［J］. Acta Optica Sinica, 1989, 9(7): 670～672

[2] [2] Zhang Shunde, Lu Bingheng, Ding Yucheng. Study on data registration of subdivided shapes in optical 3-D profilometry［J］. Chinese J. Lasers, 2001, A28(6): 533～536

[3] [3] Xu Yongan, Yang Qing, Huai Jinpeng. Analysis and modification of turntable′s axis calibration［J］. Journal of Beijing University of Aeronautics and Astronautics, 2005, 32(5): 659～663

[4] [4] Xu Yongan, Yang Qing, Huai Jinpeng. Calibration of the axis of the turntable in 4-axis laser measuring system and registration of multi-view［J］. Chinese J. Lasers, 2005, 32(5): 659～663

[5] [5] Wu Qingyang, Li Jinzhen, Su Xianyu et al.. An approach for calibrating rotor position of three-dimensional measurement system for line-structure light［J］. Chinese J. Lasers, 2008, 35(8): 1224～1227

[6] [6] Zhang Qican, Su Xianyu, Zou Xiaoping. Calibration of 3-D measurement system using multi-sensor with line structured-illuminated laser［J］. Laser Technology, 2005, 29(3): 225～228

[7] [7] S. Umeyama. Least-squares estimation of transformation parameters between two point patterns［J］. IEEE, Transactions on Pattern Analysis and Machine Intelligence, 1991, 13(4): 376～380

[8] [8] J. B. Paul, D. M. Neil. A method for registration of 3-D shapes［J］. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1992, 14(2): 293～256

[9] [9] D. Chitra, W. Gang. Registration and integration of multiple object views for 3D model construction［J］. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1998, 20(1): 83～89

[10] [10] Qiu Maolin, Ma Songde, Li Yi. Overview of camera calibration for computer vision［J］. Acta Automatica Sinica, 2000, 26(1): 43～55

[11] [11] Z. Zhang. A flexible new technique for camera calibration［J］. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2000, 22(11): 1330～1334

[12] [12] Wei Zhenzhong, Zhang Guangjun, Xu Yuan. Calibration approach for structured-lighted-stripe vision sensor［J］. Chinese Journal of Mechanical Engineering, 2005, 41(2): 210～214

[13] [13] F. Q. Zhou, G. J. Zhang. Complete calibration of a structured light stripe vision sensor through planar target of unknown orientations［J］. Image and Vision Computing, 2005, 23(1): 59～67

[14] [14] S. Y. Park, M. Subbarao. A multiview 3D modeling system based on stereo vision techniques［J］. Machine Vision and Applications, 2005, 16(12): 148～156

[15] [15] F. Sadlo, T. Weyrich, R. Peikert. A practical structured light acquisition system for point-based geometry and texture［C］. Zurich: Symposium of Point-Based Graphics: Euro-graphics/IEEE VGTC Symposium Proceedings, 2005. 89～145

[16] [16] Zeng Xiangjun, Huo Jincheng, Wu Qingyang. Calibrate method for scanning direction of 3D measurement system based on linear-structure light［J］. Chinese J. Lasers, 2012, 39(1): 0108002

[17] [17] Long Xi, Zhong Yuexian, Li Renju. 3-D surface integration in structured light 3-D scanning［J］. Journal of Tsinghua University (Science and Technology), 2002, 42(4): 477～480

[18] [18] Xing Dekui, Da Feipeng, Zhang Hu. Research and application of locating circular target with high accuracy［J］. Chinese Journal of Scientific Instrument, 2009, 30(12): 2593～2598

[19] [19] J. G. Semple, G. T. Knebone. Algebraic Projective Geometry［M］. London: Oxford University Press, 1952

[20] [20] Xue Junpeng, Su Xianyu, Dou Yunfu. An concentric circles and wedge grating-based camera self-calibration method［J］. Chinese J. Lasers, 2012, 39(3): 0308002

[21] [21] Huang Fengshan, Qian Huifen. Single camera 3D coordinate vision measuring system using a light pen［J］. Opto-Electronic Engineering, 2007, 34(4): 69～72

[22] [22] G. Golub, C. van Loan. Matrix Computations［M］. Maryland: The John Hopkins University Press, 1996

[23] [23] Wang Huifeng, Wang Bingjian. Camera radial distortion calibrating method based on moving characteristic target［J］. Acta Optica Sinica, 2012, 32(5): 0512007

[24] [24] C. Steger. An unbiased detector of curvilinear structures［J］. IEEE, Transactions on Pattern Analysis and Machine Intelligence, 1998, 20(2): 113～125