Single-Event Upset and Damage Mechanism in 8T-Global Shutter CMOS Image Sensors

Bo Wang; Liheng Wang; Weixin Liu; Zebin Kong; Yudong Li; Zhen Li; Kunshu Wang; Weiming Zhu; Ming Xuan

doi:10.3788/AOS201939.0504001

Acta Optica Sinica, Volume. 39, Issue 5, 0504001(2019)

Single-Event Upset and Damage Mechanism in 8T-Global Shutter CMOS Image Sensors

Bo Wang^1、*, Liheng Wang¹, Weixin Liu¹, Zebin Kong¹, Yudong Li², Zhen Li¹, Kunshu Wang¹, Weiming Zhu¹, and Ming Xuan¹

¹ Device Reliability Assurance Department, No.808 Institute of the Eighth Academy of China Aerospace Science and Technology Corporation, Shanghai 201109, China

² Radiation Effect Laboratory, Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi, Xinjiang 830011, China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Mar. 10, 2025

The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Bo Wang, Liheng Wang, Weixin Liu, Zebin Kong, Yudong Li, Zhen Li, Kunshu Wang, Weiming Zhu, Ming Xuan. Single-Event Upset and Damage Mechanism in 8T-Global Shutter CMOS Image Sensors[J]. Acta Optica Sinica, 2019, 39(5): 0504001

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Detectors

Received: Oct. 29, 2018

Accepted: Jan. 2, 2019

Published Online: May. 10, 2019

The Author Email:

DOI:10.3788/AOS201939.0504001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology