Opto-Electronic Engineering, Volume. 46, Issue 2, 180219(2019)
Design and error analysis of multi-spectral and multi-axis parallelism testing scheme
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Huang Fuyu, Li Gang, Shi Yunsheng, Zhang Xiaoliang, Zou Changfan, Yu Ye. Design and error analysis of multi-spectral and multi-axis parallelism testing scheme[J]. Opto-Electronic Engineering, 2019, 46(2): 180219
Paper Information
Category: Article
Received: Apr. 15, 2018
Accepted: --
Published Online: Mar. 17, 2019
The Author Email: Huang Fuyu (hfyoptics@163.com)
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