Dual-modulation difference stimulated emission depletion microscopy to suppress the background signal

Wensheng Wang; Chuankang Li; Zhengyi Zhan; Zhimin Zhang; Yubing Han; Cuifang Kuang; Xu Liu

doi:10.1117/1.AP.4.4.046001

Advanced Photonics, Volume. 4, Issue 4, 046001(2022)

Dual-modulation difference stimulated emission depletion microscopy to suppress the background signal Article Video

Wensheng Wang^1、†, Chuankang Li¹, Zhengyi Zhan¹, Zhimin Zhang¹, Yubing Han¹, Cuifang Kuang^1,2,3,4、*, and Xu Liu^1,2

¹Zhejiang University, State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering, Hangzhou, China

²Shanxi University, Collaborative Innovation Center of Extreme Optics, Taiyuan, China

³Research Center for Intelligent Chips and Devices, Zhejiang Lab, Hangzhou, China

⁴Zhejiang University, Ningbo Research Institute, Ningbo, China

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Wensheng Wang, Chuankang Li, Zhengyi Zhan, Zhimin Zhang, Yubing Han, Cuifang Kuang, Xu Liu, "Dual-modulation difference stimulated emission depletion microscopy to suppress the background signal," Adv. Photon. 4, 046001 (2022)

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Paper Information

Category: Research Articles

Received: Feb. 11, 2022

Accepted: Jun. 11, 2022

Posted: Jun. 13, 2022

Published Online: Jul. 7, 2022

The Author Email: Kuang Cuifang (cfkuang@zju.edu.cn)

DOI:10.1117/1.AP.4.4.046001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology