Second-Order Grating Inscribing and Sensing Characteristics Based on Phase Mask

YANG Duo; LIAO Jingjing; LI Qihui; YANG Zhongxu; XIN Jingtao

doi:10.16818/j.issn1001-5868.20240918001

Semiconductor Optoelectronics, Volume. 46, Issue 2, 374(2025)

Second-Order Grating Inscribing and Sensing Characteristics Based on Phase Mask

YANG Duo^1,2, LIAO Jingjing^1,2, LI Qihui^1,2, YANG Zhongxu^1,2, and XIN Jingtao^1,2,3

¹Key Laboratory of the Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science & Technology University, Beijing 100192, CHN

²Beijing Laboratory of Optical Fiber Sensing and System, Beijing Information Science & Technology University, Beijing 100016, CHN

³Guangzhou Nansha Intelligent Photonic Sensing Research Institute, Guangzhou 511462, CHN

show less

Abstract Get PDF(in Chinese)

Figures & Tables(0)

Tools

Get Citation

Copy Citation Text

YANG Duo, LIAO Jingjing, LI Qihui, YANG Zhongxu, XIN Jingtao. Second-Order Grating Inscribing and Sensing Characteristics Based on Phase Mask[J]. Semiconductor Optoelectronics, 2025, 46(2): 374

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category:

Received: Sep. 18, 2024

Accepted: Sep. 18, 2025

Published Online: Sep. 18, 2025

The Author Email:

DOI:10.16818/j.issn1001-5868.20240918001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology