Study on the Current Situation and Trends of OLED Defect Inspection for CELL Phase

Tian QIU; Xiaoyan LIN; Xin ZHANG; Chuanbo QIN; Chen Jung TSAI; Lin LUO; Honglong NING

doi:10.19453/j.cnki.1005-488x.2021.04.014

Optoelectronic Technology, Volume. 41, Issue 4, 324(2021)

Study on the Current Situation and Trends of OLED Defect Inspection for CELL Phase

Tian QIU¹, Xiaoyan LIN¹, Xin ZHANG¹, Chuanbo QIN¹, Chen Jung TSAI², Lin LUO³, and Honglong NING^4、*

¹Wuyi University⁃Institute of Semiconductors， CAS Joint Lab of Digital Optical Chip, Wuyi University , Jiangmen Guangdong, 529020,CHN

²Astri , Hong Kong, 999077,CHN

³Engineering College, Peking University, Beijing, 100871,CHN

⁴Institute of Polymer Optoelectronic Materials and Devices, State Key Laboratory of Luminescent Materials and Devices, South China University of Technology, Guangzhou 51060，CHN

show less

Abstract Get PDF(in Chinese)

Figures & Tables(10)

Fig. 1. The manufacturing process of OLED

Download full size

View in Article

Fig. 2. The diagram of evaporation process

Download full size

View in Article

Fig. 3. The visual detection scheme

Download full size

View in Article

Fig. 4. PG and aging test system made up of PG

Download full size

View in Article

Fig. 5. Comparison before and after defect compensation

Download full size

View in Article

Table 1. Three main detection methods and contents of CELL segment

View table

View in Article

Table 1. Three main detection methods and contents of CELL segment

检测手段	检测原理	检测内容
光学检测	光学成像	点缺、线缺、MURA、金属残留、涂布不均、颗粒、曝光异常、蚀刻不净、贴合异物
电学检测	激励响应法	曝光异常、像素、色偏、残像
人工目检	裸眼或使用放大镜观测	MURA、针孔、颗粒、涂布不均、残像、屏幕外观损坏、屏幕物理瑕疵点

Table 2. Comparison of OLED semi⁃finished screen appearance inspection items based on AOI

View table

View in Article

Table 2. Comparison of OLED semi⁃finished screen appearance inspection items based on AOI

屏幕外观检测项目	手段	目的
缺陷数量	迭代差影法	得出像素差
亮度	去噪、平均灰度值	求亮度均值
面缺陷	阈值分割	目标提取
缺陷面积	边缘内像素点数	检测目标区域大小
MURA	数学形态学分割法	将缺陷分割出来
划痕	暗场成像	得到划痕亮度

Table 3. List of platform parameter description

View table

View in Article

Table 3. List of platform parameter description

功能和性能项	典型值
液晶屏型号	TPA034
分辨率（RGB）	480×480
有效显示面积/mm	60.48×60.48
亮度/(cd·m^-2)	7~750
屏蔽状态	有
加热状态	有
设计方案项
二合一玻璃尺寸/mm	A×B×C
加热玻璃尺寸/mm	D×E×F
导光板尺寸/mm	H×I×J
技术状态项	SJPT⁃034⁃01⁃V01

注：外形尺寸具体数值以字母代替

Table 3. Comparison of OLED semi-finished light test items based on AOI

View table

View in Article

Table 3. Comparison of OLED semi-finished light test items based on AOI

测试项目	测试参数	测试手段
点类、线类缺陷	灰度值	双阈值分割法
MURA缺陷	梯度变化	算法
像素阶跃	灰度值	边界检测法
对比度	信号强度的最大差值	滤波器调制
色度	三刺激值x、y、z	测色仪

Table 4. Equipment manufacturers for reference

View table

View in Article

Table 4. Equipment manufacturers for reference

厂家	地点	产品
武汉精测电子	湖北武汉	PG， LCD CELL test, AMOLED CELL上料机，下料机LCD检查设备
联得装备	广东深圳	全自动OCA特显整合设备，全自动OLED 3D贴合整线
集银科技	广东深圳	全自动高精度偏贴机，全自动全贴合机
中导光电	广东肇庆	亮场光学检测系统
鑫三力	广东深圳	全自动贴付机，全自动OCG
致茂电子	台湾	各类电子仪器，OLED老化测试，图形发生器
晶彩科	台湾新竹	显示缺陷判定和定位
集银科技	广东深圳	JM⁃962CII背光源前工序全自动组装机，JM⁃965CII背光源后工序全自动叠片机

Tools

Get Citation

Copy Citation Text

Tian QIU, Xiaoyan LIN, Xin ZHANG, Chuanbo QIN, Chen Jung TSAI, Lin LUO, Honglong NING. Study on the Current Situation and Trends of OLED Defect Inspection for CELL Phase[J]. Optoelectronic Technology, 2021, 41(4): 324

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Study Report

Received: Mar. 26, 2021

Accepted: --

Published Online: Aug. 3, 2022

The Author Email: NING Honglong (ninghb@scut.edu.cn)

DOI:10.19453/j.cnki.1005-488x.2021.04.014

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology