Opto-Electronic Engineering, Volume. 30, Issue 5, 59(2003)
A Fast Subpixel Edge Measurement Method Based on Sobel-Zernike Moment Operator
Figures & Tables(0)
Tools
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Fast Subpixel Edge Measurement Method Based on Sobel-Zernike Moment Operator[J]. Opto-Electronic Engineering, 2003, 30(5): 59
Paper Information
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20