Subaperture stitching testing of an aspherical surface

Xiaokun Wang

doi:10.3788/cjl201239.s108002

Chinese Journal of Lasers, Volume. 39, Issue s1, 108002(2012)

Subaperture stitching testing of an aspherical surface

Xiaokun Wang^*

Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

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References(30)

[1] [1] H. Kurita, K. Saito, and M. Kato, Proc. SPIE 680,47 (1986).

[2] [2] D. Malacara, Optical Shop Testing (J. Wiley & Sons, New York, 1992).

[3] [3] R. B. Huxford, Proc. SPIE 5249, 230 (2004).

[4] [4] X. Zhang, Z. Li, and Z. Zhang, Infrared and Laser Engineering (in Chinese) 36,192 (2007).

[5] [5] S. O′Donohue, G. Devries, P. Murphy, and G. Forbes, Proc. SPIE 5869, 58690T (2005).

[6] [6] M. Wang, Proc. SPIE 4927, 673 (2002).

[7] [7] T. Yatagai, Opt. Eng. 23, 357 (1984).

[8] [8] H. Liu, Z. Lu, and F. Li, Opt. Express 12, 4348 (2005).

[9] [9] J. H. Burge, Proc. SPIE 2576, 258 (1995).

[10] [10] J. B. Song and Y. W. Lee, Proc. SPIE 6034, 60341M (2006).

[11] [11] X. Zhang, Proc. SPIE 4231, 24 (2000).

[12] [12] J. E. Negro, Appl. Opt. 23, 1921 (1984).

[13] [13] O. Masashi, O. Katsuyuki, and T. Jumpei, Opt. Eng. 33, 608 (1994).

[14] [14] S. Aric, K. William, and T. Marc, Proc. SPIE 5494, 81 (2004).

[15] [15] J. Fleig, P. Dumas, P. E. Murphy, and G. W. Forbes, Proc. SPIE 5188, 296 (2003).

[16] [16] C. J. Kim, Appl. Opt. 21, 4521 (1982).

[17] [17] T. W. Stuhlinger, Proc. SPIE 656, 118 (1986).

[18] [18] O. Masashi and O. Katsuyuki, Proc. SPIE 1720, 444 (1992).

[19] [19] S. Chen, “Geometrical Approach to Subaperture Stitching Interferometry for Aspheric Surface”, PhD. Thesis (National University of Defense Technology, 2006).

[20] [20] M. Tricard, A. Shorey, B. Hallock, and P. Murphy, Proc. SPIE 6273, 62730L (2006).

[21] [21] P. Murphy, J. Fleig, and G. Forbes, Proc. SPIE 6293, 62930J (2006).

[22] [22] M. Tricord, P. Dumas, and G. Forbes, Proc. SPIE 5638, 284 (2005).

[23] [23] X. K. Wang, L. H. Wang, and X. J. Zhang, Optics and Precision Engineering(in Chinese) 15, 192 (2007).

[24] [24] P. E. Murphy, J. Fleig, G. Forbes and M. Tricard, Proc. SPIE 5786, 113 (2005).

[25] [25] D. Xue, L. Zheng, and X. Zhang, Proc. SPIE 5638, 752 (2005).

[26] [26] X. Wang, “Research on the technique for testing of aspheric surfaces by subaperture stitching interferometry”, PhD. Thesis (Changchun Institute of Optics，Fine Mechanics and Physics, 2008).

[27] [27] X. Wang, L. Zheng, and B. Zhang, Proc. SPIE 7283, 72832J (2009).

[28] [28] P. Guo and J. Yu, Proc. SPIE 6150, 259 (2006).

[29] [29] J. M. Sasian, S. A. Lerner, and J. H. Burge, Proc. SPIE 3739, 444 (1999).

[30] [30] P. Beraud, J. Espiard, and R. Geyl, Proc. SPIE 2536, 413 (1995).