Acta Optica Sinica, Volume. 43, Issue 6, 0612002(2023)

Scattered Ray Tracing Method Based on BRDF Model by Rejection Sampling Method

Xulei Lun, Dan Zhu, Zhishan Gao, Ningyan Xu, Wenyou Qiao, and Qun Yuan*
Author Affiliations
  • School of Electronic and Optical Engineering, Nanjing University of Science & Technology, Nanjing 210094, Jiangsu, China
  • show less
    Figures & Tables(9)
    Relationship of variables in BRDF
    Schematic diagrams of two ray splitting principles. (a) Probability splitting principle; (b) energy splitting principle
    Flow chart of rejection sampling method
    Simulation diagrams of ABg model。(a) x-z profile of simulation; (b) x-y profile of simulation
    Comparison of simulation repeatability and accuracy
    Repeatability and accuracy comparison of simulations with BRDF model and parameters for different materials. (a) Glass material for standard lenses; (b) shiny aluminum; (c) optical surface
    Comparison of simulation repeatability
    • Table 1. Coordinates of components in simulation

      View table

      Table 1. Coordinates of components in simulation

      Coordinate of componentsScatter surfaceLight sourceAnalysis surface
      Position coordinate(0,0,0)(-0.5,0,0.5)(1,0,1)
      Direction-cosine(0,0,1)

      (sin 45°,0,

      -sin 45°)

      (0,0,-1)
    • Table 2. BRDF model and parameters for different materials

      View table

      Table 2. BRDF model and parameters for different materials

      Material typeA of ABg modelB of ABg modelg of ABg modelb0 of Harvey modelL of Harvey models of Harvey model
      Shiny aluminum164.090×10-22.050×10-32.151
      Glass of standard lens217.246×10-51.000×10-32.000
      Optical surface221.185×10-23.100×10-2-1.900
    Tools

    Get Citation

    Copy Citation Text

    Xulei Lun, Dan Zhu, Zhishan Gao, Ningyan Xu, Wenyou Qiao, Qun Yuan. Scattered Ray Tracing Method Based on BRDF Model by Rejection Sampling Method[J]. Acta Optica Sinica, 2023, 43(6): 0612002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 16, 2022

    Accepted: Aug. 1, 2022

    Published Online: Mar. 13, 2023

    The Author Email: Yuan Qun (yuanqun@njust.edu.cn)

    DOI:10.3788/AOS221331

    Topics