Acta Optica Sinica, Volume. 10, Issue 2, 161(1990)
Electronic speckle-pattern interferometry with polarization phase-shifting technique and it's application to deformation measurements
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[in Chinese], [in Chinese]. Electronic speckle-pattern interferometry with polarization phase-shifting technique and it's application to deformation measurements[J]. Acta Optica Sinica, 1990, 10(2): 161
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