Laser & Optoelectronics Progress, Volume. 55, Issue 6, 060401(2018)

Testing Method and Analysis of Far Ultraviolet Photon Counting Imaging Detector

Hongji Zhang*, Lingping He, Haifeng Wang, Xin Zheng, Zhenwei Han, Kefei Song, and Bo Chen
Author Affiliations
  • State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, Jilin 130039, China
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    Figures & Tables(13)
    (a) Structure diagram and (b) actual image of photon counting imaging detector
    Working principle diagram of photon counting imaging detector
    WSA position sensitive anode design
    Schematic of detector spectral scanning detector
    Schematic of signal processing circuit for detector quantum efficiency
    Spectral response distribution curve of detector
    Image of USAF1951 spatial resolution plate in detector
    Detector dark noise acquisition image
    Principle block diagram of detector electronic system
    Schematic of measuring the linearity of count rate of detector
    Calibration of count rate linearity of detector system
    Resolution detector at different light intensities. (a) 81200 counts/s; (b) 352300 counts/s; (c) 365800 counts/s
    • Table 1. Dark noise data of detector

      View table

      Table 1. Dark noise data of detector

      TestnumberDarkcountDark countrate /(counts·s-1)Calculated value ofdark noise /(counts·s-1·cm-2)
      123523.920.87
      223713.950.88
      323253.880.86
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    Hongji Zhang, Lingping He, Haifeng Wang, Xin Zheng, Zhenwei Han, Kefei Song, Bo Chen. Testing Method and Analysis of Far Ultraviolet Photon Counting Imaging Detector[J]. Laser & Optoelectronics Progress, 2018, 55(6): 060401

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    Paper Information

    Category: Detectors

    Received: Nov. 8, 2017

    Accepted: --

    Published Online: Sep. 11, 2018

    The Author Email: Hongji Zhang (ciomphongji@126.com)

    DOI:10.3788/LOP55.060401

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