Photonics Research, Volume. 9, Issue 5, 678(2021)
Principles to tailor the saturable and reverse saturable absorption of epsilon-near-zero material
Fig. 1. Characterization of as-deposited and annealed ITO films. SEM images showing (a) as-deposited ITO film and (b) ITO film annealed at 400˚C. (c) X-ray diffraction pattern. (d) Linear optical transmittance spectrum.
Fig. 2. Real and imaginary components of the permittivity of ITO films. (a) As-deposited ITO film. (b) Post-annealed ITO film.
Fig. 3. Optical nonlinear absorption measurement setup based on the Z-scan method.
Fig. 4. Open aperture Z-scan results of as-deposited ITO films under excitation of 1030 nm at different input fluences.
Fig. 5. Open aperture Z-scan results of as-deposited ITO films under excitation of 1440 nm at different input fluences. (a) OA Z-scan. (b) CA Z-scan.
Fig. 6. Dependence of normalized transmittance of ITO films (as-deposited and annealed) on optical intensity using different pump sources. (a) 1030 nm. (b) 1440 nm.
Fig. 7. Transient response of
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Hao Ma, Yuanan Zhao, Yuchen Shao, Yafei Lian, Weili Zhang, Guohang Hu, Yuxin Leng, Jianda Shao, "Principles to tailor the saturable and reverse saturable absorption of epsilon-near-zero material," Photonics Res. 9, 678 (2021)
Category: Optical and Photonic Materials
Received: Dec. 15, 2020
Accepted: Feb. 27, 2021
Published Online: May. 24, 2021
The Author Email: Yuanan Zhao (yazhao@siom.ac.cn)