Mug Defect Detection Method Based on Improved Faster RCNN

Laser & Optoelectronics Progress, Volume. 57, Issue 4, 041515(2020)

Dongjie Li^* and Ruohao Li

Author Affiliations

School of Automation, Harbin University of Science and Technology, Harbin, Heilongjiang 150080, China

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Dongjie Li, Ruohao Li. Mug Defect Detection Method Based on Improved Faster RCNN[J]. Laser & Optoelectronics Progress, 2020, 57(4): 041515

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Paper Information

Category: Machine Vision

Received: May. 30, 2019

Accepted: Aug. 15, 2019

Published Online: Feb. 20, 2020

The Author Email: Dongjie Li (dongjieli2013@163.com)

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