[1] [1] Lou Qihong, Cong Zheng, Luo Shan. The development status of gas laser[J]. Laser & Optoelectronics Progress, 1996, 33(3): 5-7.

[2] [2] Fan Zhengxiu, Hu Haiyang, Fan Ruiying, et al.. Study and preparation of the high power laser coatings[J]. High Power Laser and Particle Beams, 1999, 11(2): 195-200.

[3] [3] Xiong Feng, Qiao Xueliang, Chen Jianguo, et al.. Progress in research on dielectric multilayer coating highly reflective of laser resonator[J]. Laser Journal, 2002, 23(1): 1-4.

[4] [4] Li Xiaoguang, Shen Jun. Research progress in laser induced damage on optical films[J]. High Power Laser and Particle Beams, 2010, 22 (10): 2237-2243.

[5] [5] Ren Shuxi, Ma Hongliang, Xu Guoqing, et al.. Preparation and character measurement of ZrO2 films[J]. High Power Laser and Particle Beams, 2005, (2): 222-224.

[6] [6] Wu Shigang. Phase transition model analysis of ZrO2 thin film deposited by electron-beam evaporation[J]. High Power Laser and Particle Beams, 2008, 20(10): 1724-1726.

[7] [7] Hou Haihong, Sun Xilian, Shen Yanming, et al.. Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporation[J]. Acta Physics Sinica , 2006, 55(6): 3124-3127.

[8] [8] Chang Yanhe, Jin Chunshui, Li Chun, et al.. Optical properties of oxide thin films for deep ultraviolet[J]. Chinese J Lasers, 2011, 38(12): 1207004.

[9] [9] Zhang Dawei, He Hongbo, Shao Jianda, et al.. Preparation of high power laser films based on ion-beam assisted deposition[J]. Laser Technology, 2008, 32(1): 57-60.

[10] [10] Ma Ping, Chen Songlin, Hu Jianping, et al.. Studies on the micro-structure and laser damage threshold of ZrO2 thin films deposited at different parameters[J]. Acta Optica Sinica, 2005, 25(7): 994-998.

[11] [11] Li Dan, Zhu Ziqiang, Fu Xiongying, et al.. Relations between the laser induced damage to optical thin film and the material band-gap[J]. Opto-Electronic Engineering, 1999, 26(4): 58-62.

[12] [12] Qi Hongji, Cheng Chuanfu, Yuan Jingmei, et al.. Morphology analysis and growth mechanism of zirconium dioxide thin films[J]. Acta Optica Sinica, 2003, 23(8): 974-979.

[13] [13] Wang Yanzhi, Zhang Weili, Fan Zhengxiu, et al.. Analysis for accurately fitting the refractive index of SiO2 thin film[J]. Chinese J Lasers, 2008, 35(5): 760-763.