OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 18, Issue 2, 18(2020)
Simulation and Experimental Study on Photothermal Radiation Detection of Subsurface Defects in Materials
[1] [1] Nordal P E, Kanstad S O. Photothermal radiometry[J]. Physica Scripta, 1979, 20(5-6): 659.
[2] [2] Nakamura H , Tsubouchi K , Mikoshiba N. Nondestructive and noncontact evaluation of semiconductors by photothermal radiometry[J]. Japanese Journal of Applied Physics, 1985, 24(S1): 222-224.
[4] [4] Kanstad S O, Nordal P E. Experimental aspects of photothermal radiometry[J]. Canada Journal Physics, 1986, 64(11): 1155-1164.
[5] [5] Heuret M, Bissieux C, Pincon L, et al. Characterization of ceramic coatings by photothermal radiometry[J]. Surface and Coatings Technology, 1991, 45(1-3): 325-331.
[7] [7] CAO Dan, QU Hui-ming. Research on material infrared nondestructive testing based on finite element[J]. Laser & Infrared, 2013, 43(5): 513-517.
[8] [8] Muramatsu M, Nakasumi S, Harada Y. Characterization of defects in carbon fiber-reinforced plastics by inverse heat conduction analysis using transfer matrix between layers[J]. Advanced Composite Materials, 2016, 25(6): 1-15.
[9] [9] TANF Qing-ju, LIU Jun-yan, WANG Yang, et al. Infrared image edge recognition and defect quantitative determination based on the algorithm of fuzzy C-means clustering and Canny operator[J]. Infrared and Laser Engineering, 2016, 45(9): 0928001(1-5).
[10] [10] FAN Chun-li, SUN Feng-rui, YANG li. Temperature distribution of defect surface and effect of natural convection on thermographic inspection[J]. Laser & Infrared, 2005, 35(7): 504-507.
[11] [11] Wang L, Prekel H, Liu H, et al. Thickness microscopy based on photothermal radiometry for the measurement of thin films[J]. Spectrochimica Acta Part A, 2009, 72(2): 361-365.
[12] [12] Xu G L. Engineering heat transfer[M]. Beijing: China Electric Power Press, 2011
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YIN Guo-ying, LI Ai-zhu. Simulation and Experimental Study on Photothermal Radiation Detection of Subsurface Defects in Materials[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2020, 18(2): 18
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Received: Aug. 13, 2019
Accepted: --
Published Online: Jun. 18, 2020
The Author Email: Guo-ying YIN (897761293@qq.com)
CSTR:32186.14.