[1] [1] B. C. Stuart, M. D. Feit, A. M. Rubenchik et al.. Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses[J]. Phys. Rev. Lett., 1995, 74(12): 2248～2252

[4] [4] Haiyi Sun, Zhizhan Xu, Tianqing Jia et al.. Femtosecond laser-induced breakdown of multilayers and gold film[J]. Chin. Opt. Lett., 2005, 3(1): 60～62

[7] [7] M. Lenzner, J. Kruger, S. Sartania et al.. Femtosecond optical breakdown in dielectrics[J]. Phys. Rev. Lett., 1998, 80(18): 4076～4079

[8] [8] J. M. Liu. Simple technique for measurements of pulsed Gaussian-beam spot sizes[J]. Opt. Lett., 1982, 7(5): 196～199

[9] [9] B. C. Stuart, M. D. Feit, S. Herman et al.. Nanosecond-to-femtosecond laser-induced breakdown in dielectrics[J]. Phys. Rev. (B), 1996, 53(4): 1749～1761

[10] [10] Hiroshi Tatewaki. Ionization threshold of crystalline LiF[J]. Phys. Rev. (B), 1999, 60(6): 3777～3786

[11] [11] A. Kaiser, B. Rethfeld, M. Vicanek et al.. Microscopic process in dielectrics under irradiation by subpiscosecond laser pulses[J]. Phys. Rev. (B), 2000, 61(7): 11437～11450

[12] [12] B. Rethfeld. Unified model for the free-electron avalanche in laser-irradiated dielectrics[J]. Phys. Rev. Lett., 2004, 92(18): 187401-1～187401-4

[14] [14] Tianqing Jia, Hong Chen, Yumei Zhang. Photon absorption of conduction-band electrons and their effects on laser-induced damage to optical materials[J]. Phys. Rev. (B), 2000, 61(24): 16522～16529

[15] [15] K. Sokolowski-Tinten, D. von der Linde. Generation of dense electron-hole plasmas in silicon[J]. Phys. Rev. (B), 2000, 61(4): 2643～2650