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Chinese Optics Letters, Volume. 13, Issue 9, 091301(2015)

Polarization-independent grating coupler based on silicon-on-insulator

Jingjing Zhang1... Junbo Yang1,2,*, Huanyu Lu1,3, Wenjun Wu1, Jie Huang1 and Shengli Chang1 |Show fewer author(s)
Author Affiliations
  • 1Center of Material Science, National University of Defense Technology, Changsha 410073, China
  • 2State Key Laboratory on Advanced Optical Communication Systems and Networks, Peking University, Beijing 100871, China
  • 3University of Electronic Science and Technology of China, Chengdu 610054, China
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    [2] Daigao Chen, Xi Xiao, Lei Wang, Wen Liu, Qi Yang, "Polarization rotator-splitter covering full optical communication bands based on L-shaped cross-section waveguide," Chin. Opt. Lett. 14, 041301 (2016)

    [3] Xin Chen, Chao Qiu, Zhen Sheng, Aimin Wu, Haiyang Huang, Yingxuan Zhao, Wei Li, Xi Wang, Shichang Zou, Fuwan Gan, "Design of an ultra-broadband and fabrication-tolerant silicon polarization rotator splitter with SiO2 top cladding," Chin. Opt. Lett. 14, 081301 (2016)

    [4] Ping Ma, Xuecheng Cui, Jun Zheng, Pinchun Kang, 志成 叶, "Slim OFRS based on a grating input coupler and a microprism sensing surface," Chin. Opt. Lett. 14, 112303 (2016)

    Cited By

    [4] Rui Xia, Xufeng Jing, Huihui Zhu, Weimin Wang, Ying Tian, Zhi Hong. Broadband linear polarization conversion based on the coupling of bilayer metamaterials in the terahertz region. Optics Communications, 383, 310(2017).

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    Jingjing Zhang, Junbo Yang, Huanyu Lu, Wenjun Wu, Jie Huang, Shengli Chang, "Polarization-independent grating coupler based on silicon-on-insulator," Chin. Opt. Lett. 13, 091301 (2015)

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    Paper Information

    Category: Integrated Optics

    Received: Apr. 9, 2015

    Accepted: Jun. 30, 2015

    Published Online: Sep. 14, 2018

    The Author Email: Junbo Yang (yangjunbo008@sohu.com)

    DOI:10.3788/COL201513.091301

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology