Laser & Optoelectronics Progress, Volume. 62, Issue 4, 0415010(2025)
Subregional Phase Error Self-Correction Method for Structured Light Measurement
Fig. 1. 3D measurement principle of multifrequency fringe projection profilometry
Fig. 2. Influence of gamma nonlinearity on fringes and phase. (a) Grayscale of fringes obtained from different gamma distortions; (b) ideal and real phases
Fig. 4. Fringe patterns and corresponding phase errors under different degrees of defocus. (a) Defocus 0; (b) defocus 1; (c) defocus 2; (d) phase error 0; (e) phase error 1; (f) phase error 2
Fig. 5. Schematic diagrams for solving the phase gradient threshold. (a) Fringe pattern of the standard board; (b) unwrapped phase of the standard board; (c) a column of the unwrapped phase
Fig. 6. Step block phase partitioning. (a) Step block under blank projection; (b) unwrapped phase of the step block; (c) step block Mask1; (d) step block Mask2; (e) step block Mask
Fig. 8. Results of phase error before and after correction. (a) Comparison of phase errors; (b) local amplification of phase errors
Fig. 9. Step block 3D reconstruction. (a) High-precision ceramic step blocks; (b) original reconstruction point cloud of the step block
Fig. 10. Point cloud results before and after step block correction. (a) Reconstruction result after the global correction; (b) reconstruction result after the regional correction
Fig. 11. Standard sphere reconstruction and fitting results. (a) Standard baseball bat; (b) uncorrected (RMSE is 0.039 mm); (c) Hilbert transformation method (RMSE is 0.031 mm); (d) iterative fitting method for light intensity curve (RMSE is 0.027 mm); (e) global corrected (RMSE is 0.035 mm); (f) regional corrected (RMSE is 0.026 mm)
Fig. 12. Statue reconstruction. (a) Statue; (b) uncorreected; (c) Hilbert transformation method; (d) iterative fitting method for the light intensity curve; (e) global corrected; (f) regional corrected
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Chengtong Miao, Jingjing Wu, Qiangqiang Xu. Subregional Phase Error Self-Correction Method for Structured Light Measurement[J]. Laser & Optoelectronics Progress, 2025, 62(4): 0415010
Category: Machine Vision
Received: Jun. 11, 2024
Accepted: Jul. 29, 2024
Published Online: Feb. 10, 2025
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CSTR:32186.14.LOP241459