Acta Optica Sinica, Volume. 39, Issue 10, 1034002(2019)

Soft X-Ray Absorption Spectroscopy of Low Z Element Based on Fluorescence Emission

Junqin Li1,2, Zhenhua Chen1,2, Zilong Zhao1,2, Ying Zou1,2、*, Yong Wang1,2、**, and Renzhong Tai1,2、***
Author Affiliations
  • 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Shanghai Synchrotron Radiation Facility, Zhangjiang Laboratory, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
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    Figures & Tables(8)
    Transmission of X-ray for C1 windows with different energies
    Experimental setup of fluorescence-detected soft X-ray absorption measurement
    Absorption spectrum data acquisition flow chart and software interface based on LabView. (a) Flow chart of data acquisition; (b) user interface
    Fluorescence spectra at photo energy of 700 eV
    2D-mapping of fluorescence intensity with incident photon energy varied from 680 eV to 714 eV
    F K-edge absorption spectra of target gas CF4 obtained through partial fluorescence yield
    F K-edge absorption spectrum of target gas CF4 obtained through partial fluorescence yield when the pressure is 6.7 Pa
    Fluorescence absorption spectrum for N element in iodine methylamine lead (CH3NH3PbI3)
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    Junqin Li, Zhenhua Chen, Zilong Zhao, Ying Zou, Yong Wang, Renzhong Tai. Soft X-Ray Absorption Spectroscopy of Low Z Element Based on Fluorescence Emission[J]. Acta Optica Sinica, 2019, 39(10): 1034002

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    Paper Information

    Category: X-Ray Optics

    Received: Apr. 16, 2019

    Accepted: Jun. 24, 2019

    Published Online: Oct. 9, 2019

    The Author Email: Zou Ying (zouying@zjlab.org.cn), Wang Yong (wangyong@zjlab.org.cn), Tai Renzhong (tairenzhong@zjlab.org.cn)

    DOI:10.3788/AOS201939.1034002

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