Chinese Optics Letters, Volume. 1, Issue 10, 10619(2003)

Antireflective films optimization of ZnS ceramics infrared windows

Lin Li1、*, Lianhe Dong2, and Liangzhao Huang3
Author Affiliations
  • 1National Key Lab of High Power Semiconductor Lasers, Changchun University of Science and Technology
  • 2College of Photoelectric Eng., Changchun University of Science and Technology
  • 3College of Mater. Eng., Changchun University of Science and Technology, Changchun 130022
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    References(5)

    [1] [1] J. Perini and L. S. Cohen, IEEE Trans. on EMC 35, 36 (1993).

    [2] [2] L. Y. Yang, W. D. Guan, and Z. M. Gu, Material Surface Film Technology (in Chinese) (People Traffic Press, Beijing, 1991) p. 86, 105.

    [3] [3] Y. C. Lin and W. Q. Lu, Optical Film Principle (in Chinese) (National Defence Industry Press, Beijing, 1990) p. 1, 15, 44, 171.

    [4] [4] J. Jiang, Infrared Technology (in Chinese) 4, 15 (1996).

    [5] [5] Y. Huang, J. J. Li, T. J. Ma, and Y. L. Wang, Materials Science and Engineering (in Chinese) 4, 7 (1999).

    CLP Journals

    [1] Xie Linhua, Zhu Shifu. Influence of Covalence Effect on the Optical Spectra of d2,8 Electron Systems[J]. Acta Optica Sinica, 2008, 28(2): 392

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    Lin Li, Lianhe Dong, Liangzhao Huang, "Antireflective films optimization of ZnS ceramics infrared windows," Chin. Opt. Lett. 1, 10619 (2003)

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    Paper Information

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    Received: Apr. 18, 2003

    Accepted: --

    Published Online: Jun. 6, 2006

    The Author Email: Lin Li (lilinciom@sina.com.cn)

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