Acta Optica Sinica, Volume. 7, Issue 9, 838(1987)
Determination of refractive index and thickness of a low index thin film by leaky waveguide technique
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WU QIHONG. Determination of refractive index and thickness of a low index thin film by leaky waveguide technique[J]. Acta Optica Sinica, 1987, 7(9): 838
Paper Information
Category: Instrumentation, Measurement and Metrology
Received: Nov. 27, 1986
Accepted: --
Published Online: Sep. 20, 2011
The Author Email:
CSTR:32186.14.
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