Toward augmenting tip-enhanced nanoscopy with optically resolved scanning probe tips

Jeremy Belhassen; Simcha Glass; Eti Teblum; George A. Stanciu; Denis E. Tranca; Zeev Zalevsky; Stefan G. Stanciu; Avi Karsenty

doi:10.1117/1.APN.2.2.026002

Advanced Photonics Nexus, Volume. 2, Issue 2, 026002(2023)

Toward augmenting tip-enhanced nanoscopy with optically resolved scanning probe tips

Jeremy Belhassen^1,2, Simcha Glass^1,3, Eti Teblum⁴, George A. Stanciu⁵, Denis E. Tranca⁵, Zeev Zalevsky^2,4、*, Stefan G. Stanciu^5、*, and Avi Karsenty^1,3、*

Author Affiliations

¹Jerusalem College of Technology, Lev Academic Center, Faculty of Engineering, Department of Applied Physics/Electro-Optics Engineering, Advanced Laboratory of Electro-Optics, Jerusalem, Israel

²Bar-Ilan University, Faculty of Engineering, Ramat Gan, Israel

³Nanotechnology Center for Research and Education, Lev Academic Center, Jerusalem, Israel

⁴Bar-Ilan University, The Nanotechnology Center, Ramat Gan, Israel

⁵Politehnica University of Bucharest, Center for Microscopy-Microanalysis and Information Processing, Bucharest, Romania

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Jeremy Belhassen, Simcha Glass, Eti Teblum, George A. Stanciu, Denis E. Tranca, Zeev Zalevsky, Stefan G. Stanciu, Avi Karsenty, "Toward augmenting tip-enhanced nanoscopy with optically resolved scanning probe tips," Adv. Photon. Nexus 2, 026002 (2023)

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Paper Information

Category: Research Articles

Received: Oct. 14, 2022

Accepted: Dec. 23, 2022

Published Online: Apr. 12, 2023

The Author Email: Zeev Zalevsky (zeev.zalevsky@biu.ac.il), Stefan G. Stanciu (stefan.g.stanciu@upb.ro), Avi Karsenty (karsenty@g.jct.ac.il)

DOI:10.1117/1.APN.2.2.026002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology