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Chinese Optics Letters, Volume. 2, Issue 6, 06367(2004)

A theoretical method based on Fourier spectrum analysis for the focusing performances of the X-ray compound refractive lenses

Jian Ye1, Zichun Le1、*, Jingqiu Liang2, Kai Liu1, Bisheng Quan1, Yali Qin1, and Guangxin Zhu1
Author Affiliations
  • 1College of Information Engineering, Zhejiang University of Technology, Hangzhou 310014
  • 2State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130022
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    [1] [1] B. X. Yang, Nuclear Instruments and Methods in Physics Research A 328, 578 (1993).

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    [8] [8] V. Aristov, M. Grigoriev, S. Kuznetsov, L. Shabelnikov, V. Yunkin, T. Weitkamp, C. Rau, I. Snigireva, A. Snigirev, M. Hoffmann, and E. Voges, Appl. Phys. Lett. 77, 4058 (2000).

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    CLP Journals

    [1] Zichun Le, Xinjian Zhao, Jingqiu Liang, Yaping Sun, Kai Liu, Ming Zhang, Shuqin Guo, Bisheng Quan, "Application of the probability theory in predicting 3D focusing behaviors of compound X-ray refractive lenses," Chin. Opt. Lett. 3, 10618 (2005)

    [2] Zichun Le, Kai Liu, Jingqiu Liang, "A method based on diffraction theory for predicting 3D focusing performance of compound refractive X-ray lenses," Chin. Opt. Lett. 3, 03184 (2005)

    [3] Zichun Le, Ming Zhang, Jingqiu Liang, Wen Dong, Kai Liu, Bisheng Quan, "Design and fabrication of one-dimensional focusing X-ray compound lens with Al material," Chin. Opt. Lett. 4, 556 (2006)

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    Jian Ye, Zichun Le, Jingqiu Liang, Kai Liu, Bisheng Quan, Yali Qin, Guangxin Zhu, "A theoretical method based on Fourier spectrum analysis for the focusing performances of the X-ray compound refractive lenses," Chin. Opt. Lett. 2, 06367 (2004)

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    Paper Information

    Category: X-ray Optics

    Received: Feb. 17, 2004

    Accepted: --

    Published Online: Jun. 6, 2006

    The Author Email: Zichun Le (lzc@zjut.edu.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology