Acta Physica Sinica, Volume. 69, Issue 3, 030601-1(2020)

Influence of incident illumination on optical scattering measurement of typical photoresist nanostructure

Zheng-Qiong Dong1... Hang Zhao1, Jin-Long Zhu2 and Ya-Ting Shi2,* |Show fewer author(s)
Author Affiliations
  • 1Hubei Key Laboratory of Manufacture Quality Engineering, Hubei University of Technology, Wuhan 430068, China
  • 2State Key Laboratory for Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, China
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    References(35)

    [3] Fujiwara H[J]. Spectroscopic Ellipsometry Principles and Applications, 81-141(2007).

    [16] Fu K X, Wang Z H, Zhang D Y, Zhang J, Zhang Q Z[J]. Sci. China Ser. A, 29, 356(1999).

    [18] Raymond C J, Littau M E, Chuprin A, Ward S[J]. Proceedings of SPIE, 564(2004).

    [22] Littau M, Forman D, Bruce J, Raymond C J, Hummel S G[J]. Proceedings of SPIE, 615236(2006).

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    Zheng-Qiong Dong, Hang Zhao, Jin-Long Zhu, Ya-Ting Shi. Influence of incident illumination on optical scattering measurement of typical photoresist nanostructure[J]. Acta Physica Sinica, 2020, 69(3): 030601-1

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    Paper Information

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    Received: Oct. 8, 2019

    Accepted: --

    Published Online: Nov. 10, 2020

    The Author Email:

    DOI:10.7498/aps.69.20191525

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