Measurement of the Nonlinear Circular Birefringence of a Chiral Medium with the Z-scan Technique

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Chinese Journal of Lasers, Volume. 27, Issue 7, 606(2000)

[in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, [in Chinese]², and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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References(5)

[1] [1] I. C. Khoo, F. Simoni, C. Umeton. Novel Optical Materials and Applications. New York: John Wiley & Sons. Inc., 1997. 295～323

[2] [2] T. Petralli-Mallow, T. M. Wong, J. D. Byers et al.. Circular dichroism spectroscopy at interfaces: a surface second-harmonic generation study. J. Phys. Chem., 1993, 97(7):1383～1388

[3] [3] J. J. Maki, T. Verbiest, M. Kauranen et al.. Comparison of linearly and circularly polarized probes of second-order optical activity from chiral surfaces. J. Chem. Phys., 1996, 105(2):767～772

[8] [8] H. Ashitaka, Y. Yokoh, R. Shimizu et al.. Chiral optical nonlinearity of helicenes. Nonlinear Optics, 1993, 4:281～297

[9] [9] M. Sheik-Bahae, A. A. Said, E. W. Van Stryland. High sensitivity single beam n2 measurements. Opt. Lett., 1989, 14(17):955～957

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of the Nonlinear Circular Birefringence of a Chiral Medium with the Z-scan Technique[J]. Chinese Journal of Lasers, 2000, 27(7): 606

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Paper Information

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Received: Dec. 28, 1998

Accepted: --

Published Online: Aug. 9, 2006

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Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology