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Microelectronics, Volume. 55, Issue 1, 27(2025)

Single Event Effect Detection System Design of Ultra High Speed ADC

WEN Xianchao1, WEI Yafeng1, LI Ting1, YU Zhou1, FU Dongbin1, LIU Jie2, GUO Gang3, and SUN Yi4
Author Affiliations
  • 1Chongqing GigaChip Technology Co. Ltd, Chongqing 400060, P. R. China
  • 2Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, P. R. China
  • 3China Institute of Atomic Energy, Beijing 102400, P. R. China
  • 4Beijing Institute of Spacecraft Environment Engineering, Beijing 102400, P. R. China
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    WEN Xianchao, WEI Yafeng, LI Ting, YU Zhou, FU Dongbin, LIU Jie, GUO Gang, SUN Yi. Single Event Effect Detection System Design of Ultra High Speed ADC[J]. Microelectronics, 2025, 55(1): 27

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    Paper Information

    Special Issue:

    Received: Sep. 18, 2024

    Accepted: Jun. 19, 2025

    Published Online: Jun. 19, 2025

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.240330

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology