Ultra-high-speed analog-to-digital converters (ADCs) are key components in signal processing units such as phased array radars and digital multi-mode receivers. However, their accompanying systems are susceptible to single event effects (SEE) caused by cosmic ray irradiation in space, leading to device performance degradation and, in severe cases, functional interruption. This project analyzes and studies the mechanisms of single event effects in streamlined ADCs. It proposes a ground simulation testing method for single-event latch-up (SEL), single-event upsets (SEU), and single-event transients (SET) in ultra-high-speed ADCs (≥3 GS/s). A single event effects online testing system for ultra-high-speed ADCs is implemented using CER detection principles and high-speed code value anomaly handling methods. Experimental verification was conducted at the HI-13 and HIRFL facilities, where typical single event test effects, such as SEL, SEU, and SET, were successfully monitored. Finally, a single event effect analysis of the circuit was conducted based on experimental data and circuit structure. The evaluation and application stage system verification of high-speed ADC integrated circuits is of great significance.