Measurement of the spatial coherence of hard synchrotron radiation using a pencil beam

Wenqiang Hua; Guangzhao Zhou; Yuzhu Wang; Ping Zhou; Shumin Yang; Chuanqian Peng; Fenggang Bian; Xiuhong Li; Jie Wang

doi:10.3788/COL201715.033401

Chinese Optics Letters, Volume. 15, Issue 3, 033401(2017)

Measurement of the spatial coherence of hard synchrotron radiation using a pencil beam

Wenqiang Hua¹, Guangzhao Zhou¹, Yuzhu Wang¹, Ping Zhou¹, Shumin Yang¹, Chuanqian Peng², Fenggang Bian¹, Xiuhong Li¹, and Jie Wang^1、*

Author Affiliations

¹Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China

²School of Optoelectronic Information, Chongqing University of Technology, Chongqing 400050, China

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Figures & Tables(6)

$Expansion ratio (blue circles) and visibility (red squares) plotted against the cl/L value obtained for the beam diameter L=4 μm, wavelength λ=0.15 nm, and detector distance z=1.5 m. (Inset) Normalized diffraction profiles displayed for various cl values.$

Fig. 1. Expansion ratio (blue circles) and visibility (red squares) plotted against the cl/L value obtained for the beam diameter L=4 μm, wavelength λ=0.15 nm, and detector distance z=1.5 m. (Inset) Normalized diffraction profiles displayed for various cl values.

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Fig. 2. Schematic diagram of the experimental setup at the SSRF BL19U2 beamline. The inset in the lower left corner is a scanning electron microscope image of the center portion of the grating.

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$Measured diffraction patterns obtained with a secondary source slit size of (a) 100 μm×100 μm and (b) 200 μm×200 μm for a horizontally placed grating. (c) The normalized intensity profiles for the second- and third-order diffraction peaks of the gratings along the horizontal direction.$

Fig. 3. Measured diffraction patterns obtained with a secondary source slit size of (a) 100 μm×100 μm and (b) 200 μm×200 μm for a horizontally placed grating. (c) The normalized intensity profiles for the second- and third-order diffraction peaks of the gratings along the horizontal direction.

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$Measured diffraction patterns obtained with a secondary source slit size of (a) 100 μm×100 μm and (b) 200 μm×200 μm for a vertically placed grating. (c) The normalized intensity profiles for the second- and third-order diffraction peaks of the gratings along the vertical direction.$

Fig. 4. Measured diffraction patterns obtained with a secondary source slit size of (a) 100 μm×100 μm and (b) 200 μm×200 μm for a vertically placed grating. (c) The normalized intensity profiles for the second- and third-order diffraction peaks of the gratings along the vertical direction.

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Table 1. Measured Beam Parameters of BL19U2 With a 13 μm Pinhole, Grating Period of 200 nm, Photon Energy of 12 keV, and Secondary Source Slit Sizes of 100 μm×100 μm and 200 μm×200 μm

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Table 1. Measured Beam Parameters of BL19U2 With a 13 μm Pinhole, Grating Period of 200 nm, Photon Energy of 12 keV, and Secondary Source Slit Sizes of 100 μm×100 μm and 200 μm×200 μm

	Horizontal		Vertical
Secondary source slit size (μm)	100	200	100	200
$σ_{coh}$ (μm)	20.45
$σ_{m}$ (μm)	34.87	49.77	28.87	35.41
$σ_{F μ}$ (μm)	28.23	45.38	20.38	28.91
Expansion ratio	1.71	2.43	1.41	1.73
Visibility	$7.79 \times 10^{- 4}$	$9.50 \times 10^{- 9}$	$2.41 \times 10^{- 2}$	$5.54 \times 10^{- 4}$
$c l$ (μm)	3.44	2.14	4.76	3.36

Table 2. Simulated Beam Parameters of BL19U2 Along the Beamline Using the GSM for a Photon Energy of 12 keV

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Table 2. Simulated Beam Parameters of BL19U2 Along the Beamline Using the GSM for a Photon Energy of 12 keV

	Horizontal		Vertical
Beam size at the source 0 m (μm)	154		9.79
Transverse coherence length at the source (μm)	0.47		1.24
Beam size at the KB mirror (μm)	1073	at 31.2 m	434	at 34 m
Transverse coherence length at the KB mirror (μm)	3.249	at 31.2 m	55.4	at 34 m
Degree of coherence	0.0015		0.0637
Beam size at the secondary source slit 41 m (μm)	656		296
Transverse coherence length at secondary source slit (μm)	1.99		37.8
Secondary source slit size (μm)	100	200	100	200
Beam size at the sample 50 m (μm)	74.3	80.4	17.4	33.0
Transverse coherence length at the sample (μm)	3.48	1.89	15.6	15.2
Degree of coherence after secondary source slit	0.023	0.012	0.409	0.225

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Wenqiang Hua, Guangzhao Zhou, Yuzhu Wang, Ping Zhou, Shumin Yang, Chuanqian Peng, Fenggang Bian, Xiuhong Li, Jie Wang, "Measurement of the spatial coherence of hard synchrotron radiation using a pencil beam," Chin. Opt. Lett. 15, 033401 (2017)

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Paper Information

Category: X-ray Optics

Received: Sep. 30, 2016

Accepted: Dec. 23, 2016

Published Online: Jul. 25, 2018

The Author Email: Jie Wang (wangjie@sinap.ac.cn)

DOI:10.3788/COL201715.033401

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology