Analysis of Influence on Detection Accuracy of Heterodyne Wavefront Detection Instrument

Yu Dai; Wenxi Zhang; Xinxin Kong; Sizepeng Zhao; Hao Xu; Zhetao Deng

doi:10.3788/AOS240794

Acta Optica Sinica, Volume. 44, Issue 14, 1412007(2024)

Analysis of Influence on Detection Accuracy of Heterodyne Wavefront Detection Instrument

Yu Dai^1,2、*, Wenxi Zhang^1、**, Xinxin Kong¹, Sizepeng Zhao^1,2, Hao Xu¹, and Zhetao Deng¹

Author Affiliations

¹Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100094, China

²School of Optoelectronics, University of Chinese Academy of Sciences, Beijing 101400, China

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Figures & Tables(14)

Fig. 1. Schematic diagram of fiber circulator

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Fig. 2. Schematic diagram of detection system

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Fig. 3. Relationship between relative transverse displacement and wavefront PV value

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Fig. 4. Relationships among relative transverse displacement, $δ_{f}$ and $δ_{P V}$

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Fig. 5. Relationship curve between $δ_{f}$ and $δ_{P V}$ when relative transverse displacement is 5.5 μm

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Fig. 6. Relationships among relative transverse displacement, $δ_{f}$ and $μ_{P V}$

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Fig. 7. Relationship curve between $δ_{f}$ and $μ_{P V}$ when relative transverse displacement is 5.5 μm

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Fig. 8. Relationships among relative transverse displacement, $δ_{F P S}$ and $δ_{P V}$

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Fig. 9. Relationship curve between $δ_{F P S}$ and $δ_{P V}$ when relative transverse displacement is 5.5 μm

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Fig. 10. Curves of δ_PV versus scattering noise of the detector in the condition of transverse displacement

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Fig. 11. Diagram of the experimental setup

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Fig. 12. Interferograms used for demodulation in experimental single measurement. (a) I₁; (b) I₂; (c) I₃; (d) I₄

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Fig. 13. Phase wavefront diagram of a single measurement in the experiment

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Fig. 14. Curve of wavefront PV value fluctuation measured by experiment

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Yu Dai, Wenxi Zhang, Xinxin Kong, Sizepeng Zhao, Hao Xu, Zhetao Deng. Analysis of Influence on Detection Accuracy of Heterodyne Wavefront Detection Instrument[J]. Acta Optica Sinica, 2024, 44(14): 1412007

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Apr. 1, 2024

Accepted: Apr. 18, 2024

Published Online: Jul. 17, 2024

The Author Email: Dai Yu (daiyu@aircas.ac.cn), Zhang Wenxi (zhangwx@aircas.ac.cn)

DOI:10.3788/AOS240794

CSTR:32393.14.AOS240794

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology