Acta Optica Sinica, Volume. 9, Issue 11, 1033(1989)
Ellipcometric measurement of biaxial single crystal films on biaxial crystal substrats
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SHI LUPING, JIANG MINHUA, SHAO ZHONGSHU, LIU YAOGANG, WANG JITANG. Ellipcometric measurement of biaxial single crystal films on biaxial crystal substrats[J]. Acta Optica Sinica, 1989, 9(11): 1033
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