A Single Event Effect Test System for Analog-to-Digital  Converter with Static Inputs

LIU Tao; QI Feitao; ZHU Beili; ZHANG Lin; LIU Hainan; TENG Rui; LI Bo; ZHAO Fazhan; LUO Jiajun; HAN Zhengsheng

doi:10.13911/j.cnki.1004-3365.zjea014

Microelectronics, Volume. 52, Issue 2, 329(2022)

A Single Event Effect Test System for Analog-to-Digital Converter with Static Inputs

LIU Tao^1,2, QI Feitao^1,2, ZHU Beili^1,2, ZHANG Lin^1,2, LIU Hainan^1,2, TENG Rui^1,2, LI Bo^1,2, ZHAO Fazhan^1,2, LUO Jiajun^1,2, and HAN Zhengsheng^1,2,3

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

show less

Abstract Get PDF(in Chinese)

Figures & Tables(0)

Tools

Get Citation

Copy Citation Text

LIU Tao, QI Feitao, ZHU Beili, ZHANG Lin, LIU Hainan, TENG Rui, LI Bo, ZHAO Fazhan, LUO Jiajun, HAN Zhengsheng. A Single Event Effect Test System for Analog-to-Digital Converter with Static Inputs[J]. Microelectronics, 2022, 52(2): 329

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category:

Received: Jan. 26, 2022

Accepted: --

Published Online: Jan. 16, 2023

The Author Email:

DOI:10.13911/j.cnki.1004-3365.zjea014

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology