A single event effect test system for analog-to-digital converter (ADC) with static inputs was proposed. The system was built on NI’s Peripheral Component Interconnection Extensions for Instrumentation platform (PXI). By applying trigger mode, the different instrument modules in PXI platform could cooperate and respond in high frequency. By applying continuous data capture and real-time comparison with expected value, the system could observe and store outputs beyond ADC’s error-band window. Based on this system, a single event effect radiation experiment was carried out upon a self-developed 10 bit 25 MS/s ADC. The result showed that the system could precisely capture sensitive data, which provide comprehensive data services for single event effect measurement and radiation-hardened design of ADC.