[1] [1] D. Diehl, R. H. Ellerbrock, and G. E. Schaumann, Eur. J. Sol. Sci. 60, 557 (2009).

[2] [2] P. Laurens, M. Ould Bouali, F. Meducin, and B. Sadras, Appl. Surface Sci. 154-155, 211 (2000).

[3] [3] S. Bhattacharya, A. Datta, J. M. Berg, and S. Gangopadhyay, Journal of Microelecrtomech. Syst. 14, 590 (2005).

[4] [4] Y. Yonemoto and T. Kunugi, J. Chem. Phys. 130, 144106 (2009).

[5] [5] M. K. Dawood, H. Zheng, N. A. Kurniawan, K. C. Leong, Y. L. Foo, R. Rajagopalan, S. A. Khan, and W. K. Choi, Soft Matter 8, 3549 ( 2012).

[6] [6] C. Sun, X. Zhao, Y. Han, and Z. Gu, Thin Solid Films 516, 4059 (2008).

[7] [7] M. E. Schrader and G. I. Loeb, Modern Approaches to Wettability. Theory and Applications (Plenum Press, New York, 1992).

[8] [8] P. G. de Gennes, Rev. Mod. Phys. 57, 827 (1985).