Metrology & Measurement Technology, Volume. 45, Issue 3, 111(2025)

OCR system for pressure instruments based on convolutional neural network

Jingxing WANG, Shilin CHEN, Yiming LI, Li WANG, Wei SHI, and Fang LIU
Author Affiliations
  • AVIC Changcheng Institute of Metrology & Measurement,Beijing100095,China
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    Jingxing WANG, Shilin CHEN, Yiming LI, Li WANG, Wei SHI, Fang LIU. OCR system for pressure instruments based on convolutional neural network[J]. Metrology & Measurement Technology, 2025, 45(3): 111

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    Paper Information

    Category: Metrology,Measurement and Calibration

    Received: Feb. 14, 2025

    Accepted: --

    Published Online: Sep. 3, 2025

    The Author Email:

    DOI:10.11823/j.issn.1674-5795.2025.03.10

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