Metrology & Measurement Technology, Volume. 45, Issue 3, 111(2025)
OCR system for pressure instruments based on convolutional neural network
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Jingxing WANG, Shilin CHEN, Yiming LI, Li WANG, Wei SHI, Fang LIU. OCR system for pressure instruments based on convolutional neural network[J]. Metrology & Measurement Technology, 2025, 45(3): 111
Category: Metrology,Measurement and Calibration
Received: Feb. 14, 2025
Accepted: --
Published Online: Sep. 3, 2025
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