Spectroscopy and Spectral Analysis, Volume. 40, Issue 10, 3066(2020)

Terahertz Thickness Measurement Based on Stochastic Optimization Algorithm

Hong-zhen ZHANG1,1、*, Ming-xia HE1,1, Li-li SHI1,1, and Peng-fei WANG1,1
Author Affiliations
  • 1[in Chinese]
  • 11. State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
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    References(9)

    [2] Kuzmenko A B, Mechelen J L M V, Merbold H[D]. Optics Letters, 39, 3853(2014).

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    [7] Iwata T, Mizutani Y, Uemura H et al[D]. Optics Express, 22, 20595(2014).

    [8] Shen YC, Su K, Zeitler J A[D]. IEEE Transactions on Terahertz Science & Technology, 4, 432(2014).

    [9] Akagi M, Izutani Y, Kitagishi K. Measurements of Paint Thickness of Automobiles by Using THz Time-Domain Spectroscopy[D]. International Conference on Infrared, Millimeter, and Terahertz Waves, IEEE(2012).

    [10] Sawanaka K, Yasuda T, Yasui T et al[D]. Applied Optics, 44, 6849(2005).

    [12] Nguyen D T, Volker W, Weber K et al. Non-Destructive Measurement of Thickness and Refractive Index of Multilayer Coating on Metal Substrate[D]. International Conference on Infrared, Millimeter, and Terahertz Waves, IEEE(2016).

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    Hong-zhen ZHANG, Ming-xia HE, Li-li SHI, Peng-fei WANG. Terahertz Thickness Measurement Based on Stochastic Optimization Algorithm[J]. Spectroscopy and Spectral Analysis, 2020, 40(10): 3066

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    Paper Information

    Category: Research Articles

    Received: Sep. 10, 2019

    Accepted: --

    Published Online: Jun. 18, 2021

    The Author Email: Hong-zhen ZHANG (zhanghongzhen2018@163.com)

    DOI:10.3964/j.issn.1000-0593(2020)10-3066-05

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