Chinese Journal of Lasers, Volume. 52, Issue 7, 0704001(2025)

Wavefront Aberration Measurement of Frequency‐Doubling‐Crystal‐Lens System Based on Transmission Deflectometry

Yu Feng1, Ruiyang Wang1、**, Dahai Li1,2、*, Zekun Zhang1, Renhao Ge1, Wei Hu1, and Manwei Chen1
Author Affiliations
  • 1College of Electronics and Information Engineering, Sichuan University, Chengdu 610065, Sichuan , China
  • 2School of Aeronautics and Astronautics, Sichuan University, Chengdu 610065, Sichuan , China
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    Figures & Tables(12)
    Reverse ray-tracing model of simplified FOA system
    Structure of crystal. (a) Cutting orientation of KDP crystal; (b) optical axis direction of KDP crystal
    Reverse ray-tracing process of KDP crystal
    Simulation of ray-tracing. (a) Forward ray-tracing; (b) reverse ray-tracing
    System simulation results after removing the first four terms of Zernike polynomials without additional surface shapes. (a) Wavefront aberration for forward ray-tracing of o light; (b) wavefront aberration for reverse ray-tracing of o light; (c) difference between Figs.5(a) and (b); (d) wavefront aberration result for forward ray-tracing of e light; (e) wavefront aberration result for reverse ray-tracing of e light; (f) difference between Figs.5 (d) and (e)
    Simulated crystal surface shapes and coordinate distributions of o and e light at exit surface. (a) Front surface shape of crystal; (b) rear surface shape of crystal; (c) coordinate distribution before introducing surface shape; (d) coordinate distribution after introducing surface shape
    System simulation results after removing the first four terms of Zernike polynomials with additional surface shapes. (a) Wavefront aberration for forward ray-tracing of o light; (b) wavefront aberration for reverse ray-tracing of o light; (c) difference between Figs.7(a) and (b); (d) wavefront aberration result for forward ray-tracing of e light; (e) wavefront aberration result for reverse ray-tracing of e light; (f) difference between Figs.7 (d) and (e)
    Experimental setup
    Experimental images. (a) Unloaded fringe pattern; (b) distorted fringe pattern; (c) crystal birefringence pattern
    Simulation and theoretical results of system after removing the first four terms of Zernike polynomials. (a) Simulated wavefront aberration of o-light; (b) simulated wavefront aberration of e-light; (c) theoretical wavefront aberration of o-light; (d) theoretical wavefront aberration of e-light
    Experimental and simulation results of system after removing the first four terms of Zernike polynomials. (a) Experimental wavefront aberration of o light; (b) experimental wavefront aberration of e light; (c) simulated wavefront aberration of o light; (d) simulated wavefront aberration of e light
    Wavefront aberration of single lens and surface shapes of frequency doubling crystal. (a) Wavefront aberration of lens after removing the first four terms of Zernike polynomials; (b) front surface shape; (c) rear surface shape
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    Yu Feng, Ruiyang Wang, Dahai Li, Zekun Zhang, Renhao Ge, Wei Hu, Manwei Chen. Wavefront Aberration Measurement of Frequency‐Doubling‐Crystal‐Lens System Based on Transmission Deflectometry[J]. Chinese Journal of Lasers, 2025, 52(7): 0704001

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    Paper Information

    Category: Measurement and metrology

    Received: Nov. 1, 2024

    Accepted: Dec. 10, 2024

    Published Online: Apr. 16, 2025

    The Author Email: Ruiyang Wang (rywang@scu.edu.cn), Dahai Li (lidahai@scu.edu.cn)

    DOI:10.3788/CJL241310

    CSTR:32183.14.CJL241310

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