Optoelectronic Technology, Volume. 39, Issue 2, 123(2019)
Mechanism and Improvement on High Temperature Crosstalk in Vehicle TFT LCD Devices Reliability Test
References(0)
Tools
Get Citation
Copy Citation Text
SU Lei, YANG Xiaofei, LI Xinghua, LIU Xu, MOU Xun, MENG Jia. Mechanism and Improvement on High Temperature Crosstalk in Vehicle TFT LCD Devices Reliability Test[J]. Optoelectronic Technology, 2019, 39(2): 123
Paper Information
Category:
Received: Apr. 17, 2019
Accepted: --
Published Online: Jul. 31, 2019
The Author Email: Lei SU (suleicd@boe.com.cn)
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20