Power efficiency of time-stretch imaging system by using parallel interleaving detection

Mengxuan Lv; Bo Dai; Songchao Yin; Dawei Zhang; Xu Wang

doi:10.3788/COL201614.101103

Chinese Optics Letters, Volume. 14, Issue 10, 101103(2016)

Power efficiency of time-stretch imaging system by using parallel interleaving detection

Mengxuan Lv¹, Bo Dai^1、*, Songchao Yin¹, Dawei Zhang¹, and Xu Wang²

¹Engineering Research Center of Optical Instrument and System, the Ministry of Education, Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China

²The Institute of Photonics and Quantum Sciences, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh EH14 4AS, UK

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Figures & Tables(6)

Fig. 1. Time-stretch imaging system with the parallel interleaving detection. PC: polarization controller. TODL: tunable optical delay line. PD: photodetector.

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Fig. 2. Operation principle of (a) the conventional detection and (b) the parallel interleaving detection schemes in the time-stretch imaging system.

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Fig. 3. (a) The bright-field microscopic image. (b) The images obtained from the two channels. (c) The recovered image after interleaving.

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Fig. 4. Relation between power loss and scan rate.

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Fig. 5. SNR after amplification.

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Table 1. Parameters and Constants Used in the SNR Calculation

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Table 1. Parameters and Constants Used in the SNR Calculation

Parameter	Value
$f_{dig}$	40 GHz
$N_{th}$	$1 {pA}^{2} / Hz$
$R$	0.8
$n_{Sp}$	2
$V$	192.68 THz
$Δ v$	1 THz
$G$	14.5 dB for the parallel interleaving detection 21 dB for the conventional detection
$ℏ$	$6.626 \times 10^{- 34} J \cdot s$
$E$	$1.602 \times 10^{- 19} coulomb$

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Mengxuan Lv, Bo Dai, Songchao Yin, Dawei Zhang, Xu Wang, "Power efficiency of time-stretch imaging system by using parallel interleaving detection," Chin. Opt. Lett. 14, 101103 (2016)

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Paper Information

Category: Imaging Systems

Received: May. 25, 2016

Accepted: Aug. 26, 2016

Published Online: Aug. 2, 2018

The Author Email: Bo Dai (lioneldai2014@163.com)

DOI:10.3788/COL201614.101103

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology