Fig. 1. Schematic of interference imaging system with dual-wavelength probes

Fig. 2. Extraction processing of phase shift information of interference image

Fig. 3. Schematic of ejected particle collecting setup and typical image of the particle jets

Fig. 4. Phase distribution evolution of the explosion plume

Fig. 5. Lateral distribution of phase shift of dual-wavelength probe at different position from rear surface inside damage plume

Fig. 6. Ejection distribution on the collecting plate

Fig. 7. SEM images of particle ejection generated by UV laser induced rear surface damage of fused silica

Fig. 8. Images of particle dynamic behavior

Fig. 9. Optical elements damage process on the rear surface