Noise‐resistant frequency‐domain imaging based on single‐photon detector arrays

Fig. 1. Fabrication of single-photon detection array (SPDA). (a) Photo of avalanche photodiode (APD) ID101;(b) Block diagram of reverse bias voltage; (c) Printed circuit board (PCB) of 4 × 4 array; (d) Photo of 4 × 4 SPDA

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Fig. 2. Photon detection efficiency and dark counts of SPDA before and after optimization. (a) Dark counts before optimizing the bias voltage; (b) Photon detection efficiency before optimizing the bias voltage; (c)(d) Photo counts and dark counts of #1 APD, #10 APD versus bias voltage; (e) Dark counts after optimizing the bias voltage; (f) Photon detection efficiency after optimizing the bias voltage

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Fig. 3. Photon counting imaging (PCI) before and after optimization. (a) Schematic diagram of the experimental setup;(b) Photography of MLA; (c) PCI before optimizing the photon detection efficiency; (d) Background noise distribution with (w/) and without (w/o) optimization; (e) PCI after optimizing the photon detection efficiency;(f) Signal distribution with (w/) and without (w/o) optimization

Fig. 4. [in Chinese]

Table 1. Comparison of SPAD parameters before and after optimization
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Table 1. Comparison of SPAD parameters before and after optimization
Optimization Detection efficiency/% Dark counts/Hz
Maximum Minimum Average Deviation Maximum Minimum Average Deviation
Before 21.9 8.2 15.9 3.9 134 68 102.6 13.6
After 30.0 24.2 28.1 1.2 10420 592 3791 3470

Table 2. $C_{N R}$ of frequency‐domain and time‐domain imaging under different noise levels

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Table 2. $C_{N R}$ of frequency‐domain and time‐domain imaging under different noise levels

Ratio of noise-to-signal	Frequency-domain imaging	Time-domain imaging
0.92	6.59 ± 0.63	0.030 ± 0.014
3.5	6.12 ± 0.48	0.024 ± 0.013
9.8	5.84 ± 0.50	0.017 ± 0.012
34.5	3.87 ± 0.44	0.011 ± 0.010
104	2.29 ± 0.54	0.008 ± 0.007

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Maolin LU, Miaoqing BAI, Chengbing QIN. Noise‐resistant frequency‐domain imaging based on single‐photon detector arrays[J]. Chinese Journal of Quantum Electronics, 2025, 42(4): 537

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Paper Information

Category: Special Issue on...

Received: Dec. 12, 2024

Accepted: --

Published Online: Jul. 31, 2025

The Author Email: Miaoqing BAI (bmq@sxu.edu.cn), Chengbing QIN (chbqin@sxu.edu.cn)

DOI:10.3969/j.issn.1007-5461.2025.04.009

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Comparison of SPAD parameters before and after optimization

Table 1. Comparison of SPAD parameters before and after optimization

Table 2. CNR of frequency‐domain and time‐domain imaging under different noise levels

Table 2. CNR of frequency‐domain and time‐domain imaging under different noise levels

Table 2. $C_{N R}$ of frequency‐domain and time‐domain imaging under different noise levels

Table 2. $C_{N R}$ of frequency‐domain and time‐domain imaging under different noise levels