Chinese Journal of Lasers, Volume. 50, Issue 18, 1804003(2023)

Quadri-Wave Lateral Shearing Interference Wavefront Reconstruction Based on Path Guidance

Xingzhi Min1,2,3, Yaxuan Duan1,3、*, Zhengzhou Wang1,3, Xiaoyi Chen1,3, Zhiyuan Tang1,3, Pu Wang1,3, and Yao Fan1,3
Author Affiliations
  • 1Advanced Optical Instrument Research Department, Xi an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi an 710119, Shaanxi, China
  • 2University of Chinese Academy of Science, Beijing 100049, China
  • 3Xi an Key Laboratory of High Power Laser Measurement Technology and Instrumentation, Xi an 710119, Shaanxi, China
  • show less
    References(29)

    [1] Velghe S, Primot J, Guérineau N et al. Wave-front reconstruction from multidirectional phase derivatives generated by multilateral shearing interferometers[J]. Optics Letters, 30, 245-247(2005).

    [3] Li P, Tang F, Wang X Z. Comparison of processing speed of typical wavefront reconstruction methods for lateral shearing interferometry[J]. Applied Optics, 60, 312-325(2021).

    [4] Ling T, Yang Y Y, Yue X M et al. Common-path and compact wavefront diagnosis system based on cross grating lateral shearing interferometer[J]. Applied Optics, 53, 7144-7152(2014).

    [5] Ling T, Yang Y Y, Liu D et al. General measurement of optical system aberrations with a continuously variable lateral shear ratio by a randomly encoded hybrid grating[J]. Applied Optics, 54, 8913-8920(2015).

    [6] Bon P, Maucort G, Wattellier B et al. Quadriwave lateral shearing interferometry for quantitative phase microscopy of living cells[J]. Optics Express, 17, 13080-13094(2009).

    [7] Bon P, Wattellier B, Monneret S. Modeling quantitative phase image formation under tilted illuminations[J]. Optics Letters, 37, 1718-1720(2012).

    [8] Wang J Y, You W, Jiao Y H et al. Quadriwave gradient light inteference microscopy for lable-free thick sample imaging[J]. Optics Express, 29, 41719-41730(2021).

    [9] Baffou G. Quantitative phase microscopy using quadriwave lateral shearing interferometry (QLSI): principle, terminology, algorithm and grating shadow description[J]. Journal of Physics D: Applied Physics, 54, 294002(2021).

    [10] Dai F Z, Tang F, Wang X Z et al. Modal wavefront reconstruction based on Zernike polynomials for lateral shearing interferometry: comparisons of existing algorithms[J]. Applied Optics, 51, 5028-5037(2012).

    [11] Bon P, Aknoun S, Monneret S et al. Enhanced 3D spatial resolution in quantitative phase microscopy using spatially incoherent illumination[J]. Optics Express, 22, 8654-8671(2014).

    [12] Tian X, Itoh M, Yatagai T. Simple algorithm for large-grid phase reconstruction of lateral-shearing interferometry[J]. Applied Optics, 34, 7213-7220(1995).

    [13] Liu K, Wang J, Wang H et al. Wavefront reconstruction for multi-lateral shearing interferometry using difference Zernike polynomials fitting[J]. Optics and Lasers in Engineering, 106, 75-81(2018).

    [14] Gu N T, Huang L H, Yang Z P et al. Modal wavefront reconstruction for radial shearing interferometer with lateral shear[J]. Optics Letters, 36, 3693-3695(2011).

    [15] Li J, Tang F, Wang X Z et al. Wavefront reconstruction for lateral shearing interferometry based on difference polynomial fitting[J]. Journal of Optics, 17, 065401(2015).

    [16] Guo Y F, Chen H, Xu J et al. Two-dimensional wavefront reconstruction from lateral multi-shear interferograms[J]. Optics Express, 20, 15723-15733(2012).

    [17] Zeng X, Liang P Y, Ding J P. Two-dimensional wavefront reconstruction of shearing interferograms with big shears[J]. Chinese Journal of Lasers, 32, 782-786(2005).

    [18] Xu W D, Xie Y Y, Li X S. A new method for recovering the original wave-front in lateral-shearing interferometry[J]. Chinese Journal of Lasers, 26, 982-986(1999).

    [19] Zhao D E, Li N L, Ma Y Y et al. Characteristics of double-vortex optical interferogram based on shearing interference[J]. Laser&Optoelectronics Progress, 58, 1108001(2021).

    [21] Yin Z Q. Exact wavefront recovery with tilt from lateral shear interferograms[J]. Applied Optics, 48, 2760-2766(2009).

    [22] Dai F Z, Tang F, Wang X Z et al. High spatial resolution zonal wavefront reconstruction with improved initial value determination scheme for lateral shearing interferometry[J]. Applied Optics, 52, 3946-3956(2013).

    [23] He X, Yuan L. Wavefront reconstruction based on discrete sampling of sub-aperture slope[J]. Optics and Precision Engineering, 24, 20-29(2016).

    [24] Hudgin R H. Wave-front reconstruction for compensated imaging[J]. Journal of the Optical Society of America, 67, 375-378(1977).

    [25] Fried D L. Least-square fitting a wave-front distortion estimate to an array of phase-difference measurements[J]. Journal of the Optical Society of America, 67, 370-375(1977).

    [26] Southwell W H. Wave-front estimation from wave-front slope measurements[J]. Journal of the Optical Society of America, 70, 998-1006(1980).

    [27] Nomura T, Okuda S, Kamiya K et al. Improved Saunders method for the analysis of lateral shearing interferograms[J]. Applied Optics, 41, 1954-1961(2002).

    [28] Servin M, Malacara D, Marroquin J L. Wave-front recovery from two orthogonal sheared interferograms[J]. Applied Optics, 35, 4343-4348(1996).

    [29] Elster C. Exact two-dimensional wave-front reconstruction from lateral shearing interferograms with large shears[J]. Applied Optics, 39, 5353-5359(2000).

    [30] Liu J N, Meng J, Lyu J H et al. Fast reconstruction technology of a laser beam spatial transmission characteristic curve[J]. Applied Optics, 61, 1177-1182(2022).

    [31] Malacara D. Twyman-green interferometer[M]. Optical shop testing, 46-96(2007).

    Tools

    Get Citation

    Copy Citation Text

    Xingzhi Min, Yaxuan Duan, Zhengzhou Wang, Xiaoyi Chen, Zhiyuan Tang, Pu Wang, Yao Fan. Quadri-Wave Lateral Shearing Interference Wavefront Reconstruction Based on Path Guidance[J]. Chinese Journal of Lasers, 2023, 50(18): 1804003

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Measurement and metrology

    Received: Oct. 19, 2022

    Accepted: Dec. 16, 2022

    Published Online: Aug. 28, 2023

    The Author Email: Duan Yaxuan (duanyaxuan@opt.ac.cn)

    DOI:10.3788/CJL221344

    Topics