[1] [1] Maniscalco, B P Kaminski, J Walls. Thin film thickness measurements using scanning white light interferometry [J]. Thin Solid Films, 2014, 550：10-16.

[3] [3] Tu X. Design fbrication and testing of achromatic elliptical polarizer [J]. Optics Express, 2017, 25（9）：10355-10367.

[4] [4] Jiang L. Patterned achromatic elliptical polarizer for short-wave infrared imaging polarimetry [J]. Optics Express, 2022, 30（2）：1249-1260.

[5] [5] Tu X. Design fabrication and testing of achromatic elliptical polarizer [J]. Optics Express, 2017, 25（9）：10355-10367.

[7] [7] Boulet C M. Hathaway D A Jackson. Fiber-optic-based absolute displacement sensors at 1500 nm by means of a variant of channeled spectrum signal recovery [J]. Optics Letters, 2004, 29（14）：1602-1604.

[8] [8] Shabana H. Determination of film thickness and refractive index by interferometry [J]. Polymer Testing, 2004, 23（6）：695-702.

[9] [9] Hlubina. Spectral interferometry and reflectometry used to measure thin films [J]. Applied Physics B, 2008, 92：203-207.

[11] [11] Hocke K N Kmpfer. Gap filling and noise reduction of unevenly sampled data by means of the Lomb-Scargle periodogram [J]. Atmospheric Chemistry and Physics, 2009, 9（12）：4197-4206.

[12] [12] Wang F. An improved fitting method for predicting the Zernike coefficient-wavelength curves [J]. IEEE Photonics Journal, 2021, 13（2）：1-17.