Journal of Semiconductors, Volume. 42, Issue 3, 032401(2021)
A 1.2 V, 3.1% 3σ-accuracy thermal sensor analog front-end circuit in 12 nm CMOS process
Fig. 3. (Color online) Simulation results for different numbers of folded stage used in BGR. (a) DC mismatch biased at the same current. (b) Worst variation of
Fig. 4. (Color online) Simulation results for flicker noise for normal CMOS and 4-stage folded structures.
Fig. 6. (Color online) Measured variation results for 2-
Fig. 7. (Color online) 3σ accuracy statistics for 200 chips,
Fig. 8. (Color online) Temperature linear results for
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Liqiong Yang, Linfeng Wang, Junhua Xiao, Longbing Zhang, Jian Wang. A 1.2 V, 3.1% 3σ-accuracy thermal sensor analog front-end circuit in 12 nm CMOS process[J]. Journal of Semiconductors, 2021, 42(3): 032401
Category: Articles
Received: Jul. 23, 2020
Accepted: --
Published Online: Jun. 17, 2021
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