Laser & Optoelectronics Progress, Volume. 58, Issue 5, 0504001(2021)

Injection Efficiency in Hot-Electron Devices Based on Monte Carlo Simulation

Zixiang Jiang1,2, Tingting Liu1,2, Qingxin Sun1,2, Cheng Zhang1,2、*, Tong Yu1,2, and Xiaofeng Li1,2、**
Author Affiliations
  • 1School of Optoelectronic Science and Engineering, Soochow University, Suzhou , Jiangsu 215006, China
  • 2Key Lab of Advanced Optical Manufacturing Technologies of Jiangsu Province & Key Lab of Modern Optical Technologies of Education Ministry of China, Suzhou , Jiangsu 215006, China
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    Figures & Tables(5)
    Structural diagrams of planar single-junction and double-junction hot-electron devices and injection efficiency. (a) Structural diagram of planar single-junction hot-electron device; (b) injection efficiency ηinjof hot-electron calculated by Fowler’s theory and Monte Carlo simulation; ηinj varying with incident photon energy Eph and thickness t of Au of (c) single-junction and (d) double-junction hot-electron devices; (e) structural diagram of planar double-junction hot-electron device; injection efficiency spectra at different thicknesses of Au of (f) single-junction and (g) double-junction hot-electron devices; (h) injection efficiency ratio of double- and single-junction devices at different thicknesses of Au
    Structural diagrams and hot-electron distributions of hot-electron devices with different structures. (a)(b) Cylindrical structure; (c)(d) single-junction nanowire core-shell structure; (e)(f) double-junction nanowire core-shell structure
    Injection efficiency of single-junction core-shell nanowire structure when considering electron scattering and without considering electron scattering. Injection efficiency of single-junction core-shell nanowire structure for (a)different metallic film thicknesses and (b) different nanowire radii without considering electron scattering;(c) injection efficiency as a function of t andRTiO2for Eph=2 eV; (d)‒(f) injection efficiency of hot electrons corresponding to Figs. 3(a)‒(c) when considering electron scattering
    Injection efficiency of double-junction core-shell nanowire structure when considering electron scattering and without considering electron scattering. Injection efficiency of double-junction core-shell nanowire structure for (a)different metallic film thicknesses and (b) different nanowire radii without considering electron scatterings; (c) injection efficiency as a function of t andRTiO2for Eph=2 eV; (d)‒(f) injection efficiency of hot electrons corresponding to Figs. 4(a)‒(c) when considering electron scattering
    Injection efficiency of inner and outer Schottky junction varying with RTiO2and t for Eph of 2, 2.5, and 3 eV in double-junction core-shell nanowire structures. (a)‒(c) Injection efficiency varying with RTiO2 when t=10 nm;(d)‒(f) injection efficiency varying with t when RTiO2=50 nm
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    Zixiang Jiang, Tingting Liu, Qingxin Sun, Cheng Zhang, Tong Yu, Xiaofeng Li. Injection Efficiency in Hot-Electron Devices Based on Monte Carlo Simulation[J]. Laser & Optoelectronics Progress, 2021, 58(5): 0504001

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    Paper Information

    Category: Detectors

    Received: Sep. 24, 2020

    Accepted: Nov. 12, 2020

    Published Online: Apr. 19, 2021

    The Author Email: Zhang Cheng (zhangc@suda.edu.cn), Li Xiaofeng (xfli@suda.edu.cn)

    DOI:10.3788/LOP202158.0504001

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