OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 23, Issue 3, 37(2025)

Influence of Aperture’s Axial Position on Phase Map of Spatial-Carrier Speckle Pattern Interferometry

TAO Yao1, YANG Feng-long2, WU Si-jin1, and NIU Hai-sha1
Author Affiliations
  • 1School of Instrumentation Science and Opto-electronics Engineering, Beijing University of Information Science and Technology, Beijing 100192, China
  • 2Beijing Spacecrafts Manufacturing Factory Corporation, Beijing 100094, China
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    TAO Yao, YANG Feng-long, WU Si-jin, NIU Hai-sha. Influence of Aperture’s Axial Position on Phase Map of Spatial-Carrier Speckle Pattern Interferometry[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2025, 23(3): 37

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    Paper Information

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    Received: Feb. 9, 2024

    Accepted: Jun. 24, 2025

    Published Online: Jun. 24, 2025

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