Chinese Journal of Liquid Crystals and Displays, Volume. 38, Issue 6, 712(2023)
Pose calibration of light source in Fourier ptychographic microscopy
Fig. 4. Effects of pose misalignments on the quality of reconstructed images[54].(a1~a2)Intensity and phase images of sample;(b1~b2)Reconstructed intensity and phase images when the lateral shift
Fig. 5. Principle of pose calibration with precision mechanical stages[28].(a)System configuration;(b)Calibration of the rotation and tilt misalignments;(c)Calibration of the lateral shift misalignments.
Fig. 6. Improved mechanical calibration method[27].(a)System configuration.(b1~b1)Calibration of the rotation misalignment;(c1~c4)Calibration of the lateral misalignments;(d)Intensity images of the aperture stop that imply the centrosymmetric characteristic of the optical system.
Fig. 8. Principle of brightfield spectral localization method[39].(a)Illuminating a sample with an oblique angle а;(b)Spectra of brightfield and darkfield images;(c)Pre-processing and global pose correction.
Fig. 9. Machine learning method for calibrating pose misalignment of the LED array in FPM
Fig. 10. Principle of defocusing calibration method[53].(a)Intensity image of sample;(b)Focused image used as reference;(c~d)Defocused images with the shift related to illumination wavevectors;(e)Shifts of the brightfield defocused images.
Fig. 11. Principle of exist pupil calibration method[54].(a1)Normal illumination;(a2)Oblique illumination;(b1)Captured image with normal illumination;(b2)Captured image with oblique illumination;(c)Relationship between the position of exist pupil and LED unit.
Fig. 12. Performance of exist pupil calibration method[54].(a)Reconstructed intensity image without pose misalignment;(b1~b3)Reconstructed intensity images with conventional FPM method under different pose misalignments;(c1~c3)Reconstructed intensity images with SC-FPM method under different pose misalignments;(d1~d3)Reconstructed intensity images with exist pupil correction method under different pose misalignments.
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Chuan-jian ZHENG, De-long YANG, Shao-hui ZHANG, Yao HU, Qun HAO. Pose calibration of light source in Fourier ptychographic microscopy[J]. Chinese Journal of Liquid Crystals and Displays, 2023, 38(6): 712
Category: Research Articles
Received: Jan. 15, 2023
Accepted: --
Published Online: Jun. 29, 2023
The Author Email: Shao-hui ZHANG (zhangshaohui@bit.edu.cn), Qun HAO (qhao@bit.edu.cn)