Opto-Electronic Engineering, Volume. 46, Issue 12, 180549(2019)
Research on fault injection system of FPGA in irradiation environment
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Xue Xiaoliang, Su Haibing, Shu Huailiang, Guo Shuai, Wu Wei. Research on fault injection system of FPGA in irradiation environment[J]. Opto-Electronic Engineering, 2019, 46(12): 180549
Category: Article
Received: Oct. 26, 2018
Accepted: --
Published Online: Jan. 9, 2020
The Author Email: Su Haibing (suhaibing@msn.com)