Acta Optica Sinica, Volume. 41, Issue 1, 0114006(2021)

Shanghai Soft X-ray Free-Electron Laser Test Facility

Zhentang Zhao1、*, Dong Wang1, Lixin Yin1, Guoping Fang1, Qiang Gu1, Ming Gu1, Yongbin Leng1, Bo Liu1, Qiaogen Zhou1, Liren Shen1, Meng Zhang1, Haixiao Deng1, Jiahua Chen1, Jianhui Chen1, Zhihao Chen1, Jianguo Ding1, Wencheng Fang1, Chao Feng1, Duan Gu1, Xiao Hu1, Dazhang Huang1, Maomao Huang1, Zhiqiang Jiang1, Bin Li1, Guoqiang Lin1, Yiyong Liu1, Sen Sun1, Guanghong Wang1, Xingtao Wang1, Zhen Wang1, Yanqing Wu1, Luyang Yu1, Qibing Yuan1, Wei Zhang1, Shaopeng Zhong1, Xiaobin Xia2, Chuanxiang Tang3, Wenhui Huang3, Yingchao Du3, and Lixin Yan3
Author Affiliations
  • 1Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
  • 2Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 3Department of Engineering Physics, Tsinghua University, Beijing 100084, China
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    Figures & Tables(27)
    SXFEL test facility in the SSRF campus
    Schematic layout of SXFEL test facility
    Schematic of the undulator system for HGHG cascade
    Gain curve and output spectra of 8.8 nm cascaded HGHG-FEL. (a) Gain curve; (b) output spectra
    Schematic of the undulator system for EEHG-HGHG cascade
    Gain curve and output spectra of the first stage EEHG. (a) Gain curve; (b) output spectra
    Second stage gain curve of EEHG-HGHG cascade
    Schematic of the undulator system for single stage EEHG
    Gain curve (20th harmonic) and radiation spot (30th harmonic) of single-stage EEHG. (a) Gain curve; (b) radiation spot
    Injector of the SXFEL test facility
    Laser heater. (a) Sketch; (b) physical photograph
    X-band linearizer
    Movable magnetic bunch compressor. (a) Sketch; (b) physical photograph
    Longitudinal phase space and current distribution of electron beam at the linac exit. (a) Without X-band linearizer; (b) with X-band linearizer
    C-band linac
    C-band deflecting cavity at the exit of the SXFEL linac and the measured longitudinal beam phase space distribution. (a) C-band deflecting cavity; (b) longitudinal beam phase space distribution
    U235 undulators installed in tunnel
    Cavity beam position monitor. (a) Photograph of the monitor; (b) resolution evaluation result
    X-band deflecting structures installed in the SXFEL test facility. (a) Photograph; (b) measured beam phase space when lasing
    High resolution X-ray spectrometer in diagnostic beam line. (a) Photograph; (b) measured spectrum
    Schematic of the SXFEL user facility
    • Table 1. Main parameters of the SXFEL linac

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      Table 1. Main parameters of the SXFEL linac

      ComponentParameterDesign valueMeasurement value
      InjectorBunch charge /nC0.50.52
      Beam energy /MeV~120124.9
      Bunch length (FWHM) /ps8~109.44
      Normalized emittance /(mm·mrad)≤1.50.79(x)/0.96 (y)
      Energy spread (RMS) /%≤0.140.069
      Repetition rate /Hz1010
      Main linacBeam Energy /GeV0.840.842
      Energy spread (RMS) /%<0.150.094
      Normalized emittance /(mm·mrad)≤2.52.009(x)/1.434 (y)
      Bunch length (FWHM) /ps≤1.00.71
      Bunch charge /nC0.50.525
      Peak current /A≥500810
      Repetition rate /Hz1010
    • Table 2. Main FEL parameters of the SXFEL test facility

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      Table 2. Main FEL parameters of the SXFEL test facility

      ParameterDesign valueMeasurement value
      Wavelength /nm<98.87
      Peak power /MW> 100207
      Pulse width /fs100--20069
      HGHG-HGHG cascading harmonics configuration6×56×5
      EEHG-HGHG cascading harmonics configuration6×56×5
    • Table 3. Undulator parameters in the SXFEL test facility

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      Table 3. Undulator parameters in the SXFEL test facility

      Undulator modelU235U40U55U80
      Period /mm23.5405580
      Gap control precision /μm<3<3<3<3
      Peak field /T0.650.850.700.78
      First-order integral error /(Gs·cm)<50<50<50<50
      Second-order integral error /(Gs·cm2)<3000<3000<3000<3000
      Orbit straightness (RMS) /μm<5<10<10<10
      Phase error /(°)<5<5<5<5
      Length /m331.51.5
    • Table 4. Seed laser parameters in the SXFEL test facility

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      Table 4. Seed laser parameters in the SXFEL test facility

      ParameterDesign valueMeasurement value
      Central wavelength /nm266266
      Peak power /MW>100448
      Pulse width (FWHM) /fs~150161
    • Table 5. Beam and optical diagnostic systems and their main parameters at undulator section

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      Table 5. Beam and optical diagnostic systems and their main parameters at undulator section

      ParameterMonitor typeSpecification
      Beam positionCavity BPM<1 μm@500 pC±500 μm DR
      Beam profileYAG/OTRResolution: 20 μmPositioning accuracy: 50 μm@0.5 nC
      Bunch chargeICT<1% @500 pC
      FEL pulse lengthDeflecting structureX-band, ~15 fs resolution
      FEL pulse profileFluorescence screenResolution: 20 μm
      FEL spectrumSpectrograph5--10 nm, resolution >5000
    • Table 6. Design parameters of the SXFEL user facility

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      Table 6. Design parameters of the SXFEL user facility

      ParameterSeeded FEL line SASE line
      Beam energy /GeV1.5
      Energy spread (RMS) /%≤0.1
      Normalized emittance /(mm·mrad)≤1.5
      Peak current /A≥700
      FEL operation modeExternal seedingSASE
      Seed laser wavelength /nm240--360/
      FEL output wavelength /nm3--202--10
      FEL output peak power /MW≥100≥100
      FEL output pulse width (FWHM) /fs~50~100
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    Zhentang Zhao, Dong Wang, Lixin Yin, Guoping Fang, Qiang Gu, Ming Gu, Yongbin Leng, Bo Liu, Qiaogen Zhou, Liren Shen, Meng Zhang, Haixiao Deng, Jiahua Chen, Jianhui Chen, Zhihao Chen, Jianguo Ding, Wencheng Fang, Chao Feng, Duan Gu, Xiao Hu, Dazhang Huang, Maomao Huang, Zhiqiang Jiang, Bin Li, Guoqiang Lin, Yiyong Liu, Sen Sun, Guanghong Wang, Xingtao Wang, Zhen Wang, Yanqing Wu, Luyang Yu, Qibing Yuan, Wei Zhang, Shaopeng Zhong, Xiaobin Xia, Chuanxiang Tang, Wenhui Huang, Yingchao Du, Lixin Yan. Shanghai Soft X-ray Free-Electron Laser Test Facility[J]. Acta Optica Sinica, 2021, 41(1): 0114006

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Dec. 24, 2020

    Accepted: Dec. 29, 2020

    Published Online: Feb. 23, 2021

    The Author Email: Zhao Zhentang (zhaozt@sinap.ac.cn)

    DOI:10.3788/AOS202141.0114006

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