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OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 22, Issue 6, 44(2024)

Research on Optical Lens MTF Measurement Based on Improved Inclined Slit Method

QIU Zhen1, CHEN -Weihao1, and LEI Liang1,2
Author Affiliations
  • 1School of Physics and Optoelectronic Engineering，Guangdong University of Technology，Guangzhou 510006，China
  • 2Guangdong Provincial Key Laboratory of Information Photonics Technology，Guangzhou 510006，China
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    [6] [6] Estribeau M, Magnan P. Fast MTF measurement of COMS imagers at the chip level using ISO 12233 slanted-edge methodology [C]. SPIE, 2004, 5570：557-567.

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    QIU Zhen, CHEN -Weihao, LEI Liang. Research on Optical Lens MTF Measurement Based on Improved Inclined Slit Method[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2024, 22(6): 44

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    Paper Information

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    Received: Jun. 22, 2024

    Accepted: Jan. 21, 2025

    Published Online: Jan. 21, 2025

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology